Designer particles of micron and submicron dimension

a technology of design particles and microns, applied in the direction of vacuum evaporation coating, fluid speed measurement, chemical vapor deposition coating, etc., can solve the problems of particle materials and processes that particle materials and processes cannot be produced in all sizes, and materials which may be utilized are process dependent, etc., to achieve uniform effects

Inactive Publication Date: 2002-02-21
WASHINGTON UNIV IN SAINT LOUIS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In other words, there is not a consistent number of particles of each particle size contained within a harvest of any particular process.
Furthermore, some particle materials and processes are not capable of being produced in all sizes.
Still another limitation in the prior art is that the kinds of materials which may be utilized are process dependent.
In other words, certain types of metal may not be used to produce particles through the colloidal solution process due to the chemistry.
Still other new uses may be considered and are limited solely by the ingenuity of the scientist or engineer.
Other particle shapes and sizes may be utilized and are limited only by the imagination of the designer and the physical limitations of the processes used to prepare and coat the substrate.
Items such as cost of the mask production and the time dictated this step.
High temperature treatment in an ammonia environment was used to neutralize the carboxylic acid in the exposed areas of photoresist, thus making them poorly soluble and non-photosensitive.

Method used

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  • Designer particles of micron and submicron dimension
  • Designer particles of micron and submicron dimension
  • Designer particles of micron and submicron dimension

Examples

Experimental program
Comparison scheme
Effect test

example 2

[0040] In a manner similar to example 1, Cu / Ni / Cu disks were fabricated. The diameter of the particles was 1 .mu.m, the thickness of the metal layers were 100 nm of Cu, 100 nm of Ni and 100 nm of Cu.

example 3

[0041] In a manner similar to example 2 (with no chromium predeposited), Si / Au / Si disks were made. Silicon and gold layers were deposited by electron beam evaporation in the CVC SC4500 combination thermal / e-gun evaporation system. The diameter of the particles was 1 .mu.m, the thickness of the layers were 20 nm of Si, 150 nm of Au and 20 nm of Si.

example 4

[0042] A mask for W disk fabrication was made in a manner similar to example 1. Due to the high temperature and the very slow rate of tungsten deposition in the system used, it was difficult to thermally deposit thick (>50 nm) layers onto a patterned wafer without damaging the photoresist. The following technique was used. A 200 nm layer of W was deposited by sputtering (CVC Sputter Deposition System) on the top of an Al "sacrificial" layer. 20 nm of Ta was predeposited onto the Si surface for better adhesion. The wafers were then primed by exposing them to hexamethyldisilazane in the YES oven at 90.degree. C. for 30 minutes.

[0043] The photoresist was deposited and developed as before but the photoresist pattern on the top of the W layer was now used as a protective mask for etching off some of the surrounding W. To obtain sharp profiles reactive ion etching in a CF.sub.4 plasma (RIE System, Applied Materials, California) was used. To lift off the particles, the Al "sacrificial" lay...

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Abstract

Micron-sized particles are produced in quantity by one of various methods, including generally the steps of preparing a substrate surface through a lithographic process, the surface being characterized by defining a plurality of elements, depositing a layer of particle material on the substrate surface including the elements, processing the substrate surface to isolate the material deposited on the elements, and separating the particles from the elements. The size and shape of the elements predetermine the size and shape of the particles. The elements may comprise, inter alia, pillars of photoresist or spaces on the substrate surrounded and defined by photoresist.

Description

BACKGROUND AND SUMMARY[0001] Small particles, i.e. particles approaching one micron or less, are known in the art. These particles are made with various techniques and may be comprised of widely varying materials. For example, particles may be made of gold from colloidal gold solutions, tungsten from a process involving grinding, sifting, and filtering, and still other lesser used materials such as stainless steel, frozen water, and plastic spheres. There are still other similarly sized particles made from other materials as well. However, all of these particles produced by these various methods share certain characteristics. For example, the inventor is unaware of any particles, or process for producing particles, which have a uniform size and shape regardless of whether there is an opportunity to choose a particular shape. For example, many processes produce particles which are essentially globular, but those globular shapes vary from particle to particle and also with respect to ...

Claims

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Application Information

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Patent Type & Authority Applications(United States)
IPC IPC(8): B81B1/00B81C1/00C23C14/00C23C14/04G03F7/00
CPCB81C99/008B81C2201/034C23C14/0005C23C14/042G03F7/00Y10T428/24372Y10T428/24802Y10T428/2982Y10T428/24893Y10T428/252Y10T428/259Y10T428/25
Inventor RUOFF, RODNEY S.
Owner WASHINGTON UNIV IN SAINT LOUIS
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