Copper alloy material, and method for production thereof

a technology of copper alloy and alloy material, applied in the field of copper alloy material, can solve the problems of insufficient electrical conductivity of cu—ni—si based alloy, difficult to obtain sufficient bending workability and yield stress relaxation characteristic, and achieve the effect of improving properties
US20100170595A1Inactive Publication Date: 2010-07-08FURUKAWA ELECTRIC CO LTD

Patent Information

Authority / Receiving Office
US · United States
Patent Type
Applications(United States)
Current Assignee / Owner
FURUKAWA ELECTRIC CO LTD
Publication Date
2010-07-08
Estimated Expiration
Not applicable · inactive patent

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Abstract

A copper alloy material according to the present invention is characterized in that the copper alloy material includes: an element X between 0.1% and 4% by mass, in which the element X represents one transition element or not less than two elements selected from Ni, Fe, Co and Cr; an element Y between 0.01% and 3% by mass, in which the element Y represents one element or not less than two elements selected from Ti, Si, Zr and Hf; and a remaining portion to be comprised of copper and an unavoidable impurity, wherein the copper alloy material has an electrical conductivity of not less than 50% IACS, an yield strength of not less than 600 MPa, and a stress relaxation rate of not higher than 20% as to be measured after the same is maintained for 1000 hours at a state under applying a stress of 80% of the yield strength.
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Description

TECHNICAL FIELD

[0001] The present invention relates to a copper alloy material and to a method for production thereof.BACKGROUND ART

[0002] A copper alloy material has been used for applications such as a lead frame, a connector, a terminal material, or the like of an electrical and electronic device, more specifically a connector or a terminal material to be mounted on a motor vehicle, a relay, a switch, a socket, or the like. In the applications, the copper alloy needs to have properties such as an electrical conductivity, an yield strength (an yield stress), a tensile strength, a bending workability and an yield stress relaxation characteristic. Recently, the properties need to be improved further as the demand for a smaller size, a lighter weight, a higher function, a higher package density, or a higher environment temperature of the electrical and electronic device increases.

[0003] Conventionally, a copper-based material such as phosphor bronze, red brass, brass, or the like, in ad...

Claims

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