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Polishing liquid and method for polishing ó -ó÷ compound semiconductor wafer

A polishing liquid and semiconductor technology, applied in the field of polishing liquid, can solve the problems of easily scratched wafers, etc., and achieve the possible effects of easy cleaning, reduced roughness, and reduced secondary scratches

Active Publication Date: 2008-10-15
IMDETEK
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the average particle size of cerium oxide, cerium halide and cerium sulfide compounds or tetravalent metal oxide particles is 1 to 300 nanometers, which is easy to scratch the wafer

Method used

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Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0013] Example 1: Preparation of polishing solution: (1) 10 ml of deionized water was added to 0.5 g of sodium fatty alcohol polyoxyethylene ether sulfate, left overnight, and stirred evenly. (2) Dissolve 0.22 gram of sodium dodecylbenzenesulfonate in 5 milliliters of deionized water, add 0.04 gram of coconut oleic acid diethanolamide, and stir. (3) After mixing the above two solutions, add 775 ml of absolute ethanol, stir well, add 10 ml of bromine, and mix well.

[0014] Spread the rubber pad on the polishing disc, fix the finely ground II-VI group compound semiconductor wafer on the bracket of the polishing device, add 10 ml of polishing solution onto the rubber pad, set the polishing disc rotation speed to 15r / min, and The semiconductor wafer is polished for 10 seconds, rinsed with absolute ethanol immediately, and then rinsed with high-purity water, and stored in a desiccator.

[0015] Measured with a Zygo.NewView 5000 optical profiler, the roughness of the above II-VI c...

Embodiment 2

[0016] Example 2: Preparation of polishing liquid: (1) 10 ml of deionized water was added to 0.1 g of fatty alcohol polyoxyethylene ether sodium sulfate, left overnight, and stirred evenly. (2) Dissolve 0.04 gram of sodium dodecylbenzenesulfonate in 5 milliliters of deionized water, add 0.02 gram of coconut oleic acid diethanolamide, and stir. (3) After mixing the above two solutions, add 775 ml of absolute ethanol, stir well, add 12 ml of bromine, and mix well.

[0017] Spread the rubber pad on the polishing disc, fix the finely ground II-VI group compound semiconductor wafer on the support of the polishing device, add 15 ml of polishing liquid onto the rubber pad, set the polishing disc speed to 20r / min, and The semiconductor wafer is polished for 30 seconds, rinsed with absolute ethanol immediately, and then rinsed with high-purity water, and stored in a desiccator.

[0018] Measured with a Zygo.NewView 5000 optical profiler, the roughness of the above II-VI compound semic...

Embodiment 3

[0019] Example 3: Preparation of polishing liquid: (1) 10 ml of deionized water was added to 0.21 g of fatty alcohol polyoxyethylene ether sodium sulfate, left overnight, and stirred evenly. (2) Dissolve 0.08 gram of sodium dodecylbenzene sulfonate in 5 milliliters of deionized water, and add 0.06 gram of coconut oleic acid diethanolamide, and stir. (3) After mixing the above two solutions, add 775 ml of absolute ethanol, stir well, add 13 ml of bromine, and mix well.

[0020] Spread the rubber pad on the polishing disc, fix the finely ground II-VI group compound semiconductor wafer on the bracket of the polishing device, add 18 ml of polishing solution onto the rubber pad, set the polishing disc speed to 25r / min, and The semiconductor wafer is polished for 60 seconds, rinsed with absolute ethanol immediately, and then rinsed with high-purity water, and stored in a desiccator.

[0021] Measured with a Zygo.NewView 5000 optical profiler, the roughness of the above II-VI compou...

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PUM

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Abstract

The invention discloses a polishing liquid, which comprises the following parts: 0.1-0.75g / L aliphatic alcohol polyoxyethylene ether sodium sulfate, 0.04-0.4g / L sodium dodecylbenzene sulfonate, 0.02-0.15g / L coconut oleic acid acetal amide, 1-2% bromine and anhydrous alcohol. The making method of polishing liquid comprises the following steps: paving rubber pad on the polishing disc; fising grinded II-VI compound semi-conductor wafer on the rack of polishing device; dripping 10-30ml polishing liquid on the rubber pad; setting rotary speed of polishing disc at 15-50r / min for 10-120s; washing through anhydrous alcohol and high-purity water; drying; reserving. The invention makes dirt cleaned easily, which produces polished roughness between 30 and 50A.

Description

technical field [0001] The invention relates to a polishing liquid and also relates to a method for polishing II-VI group compound semiconductor wafers with the polishing liquid. Background technique [0002] The surface state of the semiconductor wafer seriously affects the optical and electrical properties of the semiconductor device. Polishing can remove the single crystal damage layer produced during the fine grinding of the wafer. High-quality single crystal materials have strict requirements for the flatness and roughness of the surface. Therefore, high requirements are placed on the polishing process and polishing materials of semiconductor wafers. [0003] The document "Chinese Patent with Patent Application No. 02800353.5" discloses a polishing agent and a polishing method for a substrate. The document is a cerium compound with a density of 3-6 g / cm3 and an average particle size of secondary particles of 1-300 nanometers. Among them, cerium oxide, cerium halide and...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): C09G1/18H01L21/304
Inventor 马淑英介万奇华慧王涛杨光昱
Owner IMDETEK