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Testing system of resistance reversible change of electric pulse induced and its application

A test system and resistance test technology, applied in the measurement of electrical variables, general control systems, control/regulation systems, etc., can solve the problems of the same test time, low test accuracy, and small number of test points, reducing heat radiation, convenient Quick switch effect

Inactive Publication Date: 2007-07-18
SHANGHAI INST OF CERAMIC CHEM & TECH CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The main problems in the current testing process include: 1) The switching between "0" and "1" states can only be achieved by changing the polarity of the electric pulse
When manually controlling, it is difficult to achieve the same test time each time
2) Lack of equipment to study the stability and fatigue characteristics of materials
Manual testing is very limited in studying the stability and fatigue properties of materials
3) There are many devices for testing the electrical properties of materials at low temperatures, but the equipment used to test the EPIR effect and related properties of materials at low temperatures has not been reported so far
4) Lack of equipment for testing the I-V curve and resistance-temperature curve of materials with EPIR effect
5) When manually operating the test, the number of test points is small, time-consuming and laborious, and the accuracy of the test is low

Method used

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  • Testing system of resistance reversible change of electric pulse induced and its application
  • Testing system of resistance reversible change of electric pulse induced and its application
  • Testing system of resistance reversible change of electric pulse induced and its application

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0033] EPIR effect test

[0034] The sample Nd 0.7 Ce 0.3 MnO 3 Use low-temperature glue (acetal glue) to fix it on the sample stage, and set the test parameters: both positive and negative pulse voltages are 10V, and the width is 20ns. The resistance test current is 1 microampere. Click the start button in the test program to execute the test. Figure 5 and Figure 6 are the experimental results of manual testing and automatic testing of EPIR effects, respectively. The pulse voltage of the manual test is 15V and the width is 25ns. It can be clearly seen from the test results that the results of automatic testing are more repeatable and precise than manual testing. The test is convenient and fast, which greatly saves time and labor intensity.

Embodiment 2

[0036] Low temperature I-V characteristic test

[0037] La 0.7 Ca 0.3 MnO 3 Fix it on the sample stage with low-temperature glue (acetal glue), slowly cool down to 150K, the cooling process is automatically controlled by the computer through the temperature control table, and the cooling rate is: 3K / min. After the temperature stabilizes, start the I-V test procedure. The magnitude of each measured test voltage and the test time during the test are adjusted according to the sample. The test current selected in this embodiment is 1 microampere, and the test time is 300 ms. The test results are shown in Figure 7.

Embodiment 3

[0039] Test of Resistance-Temperature Curve

[0040] La 0.7 Ca 0.3 MnO 3 Use low-temperature glue (acetal glue) to fix it on the sample stage, and slowly cool down. The cooling process is automatically controlled by the computer through the temperature control meter, and the cooling rate is: 3K / min. During the cooling process, the computer scans the temperature once every 300ms. When the temperature reaches the temperature to be measured, the computer scans the voltmeter and thermometer in turn, reads the respective values, and calculates the resistance value at this time. The test current and test time are controlled by a computer. The test current selected in this embodiment is 1 microampere, and the test time is 300 ms. The test results are shown in Figure 8.

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Abstract

A test system with resistance reversible change being induced by electric pulse consists of control unit, polarity change-over unit of pulse voltage, low temperature test platform and resistance test unit. It is featured as making test-piece be sandwich structure, using digital O / I card to control on / off state of relay for realizing change-over of pulse voltage polarity automatically.

Description

technical field [0001] The invention relates to a test system for electric pulse-induced reversible change of resistance and its application. Background technique [0002] Manganese oxide Re with perovskite structure 1-x A x MnO 3 (Re=rare earth metal ions, A=alkaline earth metal ions 0≤x≤1) Under the induction of electric pulses, the resistance of the thin film material changes reversibly. There are 2 to 3 orders of magnitude differences between the high and low resistance states in the process of system resistance change. After the applied electric pulse stops, the changed high and low resistance saturation states have good retention (the high and low resistance of the material has no obvious attenuation with time, that is, the material always maintains a "0" or "1" state). That is: it has EPIR (Electric-pulseInduced resistance switching) effect. The EPIR effect has the characteristics of reversible resistance change at room temperature, short time required for resist...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00G05D23/19G05B15/02
Inventor 陈立东吴子华王群尚大山
Owner SHANGHAI INST OF CERAMIC CHEM & TECH CHINESE ACAD OF SCI