Process for nondestructively measuring nano grain stress condition

A nanoparticle and stress state technology, applied in the field of X-ray measurement, can solve the problem of inability to measure and obtain nanoparticle stress

Inactive Publication Date: 2008-02-06
TONGJI UNIV
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Problems solved by technology

[0003] Aiming at the shortcomings of the inability to measure and obtain nanoparticle stress in the prior art, the present invention aims to provide a method for non-dest

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  • Process for nondestructively measuring nano grain stress condition
  • Process for nondestructively measuring nano grain stress condition
  • Process for nondestructively measuring nano grain stress condition

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Embodiment Construction

[0015] Take the extended X-ray absorption fine structure spectroscopy EXAFS measurement of the stress of silver nanoparticles in glass as an example:

[0016] 1. Preparation of silver nanoparticle glass: Three silver nanoparticle glass samples were prepared by ion exchange method, namely Ag1, Ag2, and Ag3, and the silver nanoparticles in the samples Ag1, Ag2 and Ag3 were observed by Phillips CM200 transmission electron microscope (TEM). 7nm, 4nm and 2.8nm respectively (see Figure 1).

[0017] 2. Characterization of silver nanoparticle structure: the measurement temperature range is 12K-298K. Ag K-edge X-ray absorption fine structure spectra were analyzed with the commercial UWXAFS3.0 package. Ag K-edge X-ray absorption fine structure spectra were collected at the X1 experimental station of the Synchrotron Radiation Center in Hamburg, Germany. The theoretical phase function and amplitude function of Ag were calculated using the theoretical EXAFS equation, and they were used t...

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Abstract

The present invention relates to a new method for nondestructively measuring nanometer particle stress state, which belongs to the X ray measuring field. An X ray absorption fine structure spectrum is used to measure the nanometer particle interatomic distance wrapped in a medium material, and through analyzing the change of the nanometer particle interatomic distance, the stress condition and the size of the nanometer particle can be calculated. The fundamental difference between the method and the existing stress measuring method is that the X ray absorption fine structure spectrum, a nondestructive measuring method is used to analyze and measure the stress of the nanometer particle. The method fundamentally fills the blank of nanometer particle stress analysis, and has obvious application value in the analysis of the nanometer particle stress state, the control of the ordered growth of the nanometer particle, and the application of a quantum device.

Description

technical field [0001] The invention belongs to the field of X-ray measurement, and relates to a new method for measuring the stress state of nano-particles. Background technique [0002] The matrix in the composite material doped with metal nanoparticles separates the nanoparticles from each other, forming quantum dots. When the size of the nanoparticles is comparable to the de Broglie wavelength, coherence wavelength and exciton Bohr radius of electrons, quantum size effects will arise. At the same time, when the size of the nanoparticles is much smaller than the wavelength of the optical field, the electric field acting on the nanoparticles is significantly different from the macroscopic field of the surrounding medium, and the polarization process changes the local permittivity, resulting in a dielectric confinement effect, resulting in The local field enhancement causes a large third-order nonlinear optical effect. Such materials have potential applications in the fiel...

Claims

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Application Information

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IPC IPC(8): G01N13/00G01L1/25
Inventor 杨修春杜天伦钱达兴黄文旵
Owner TONGJI UNIV
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