Method for acquiring rough surface of silicon hydride thin film
A technology of hydrogenated silicon and thin film, which is applied in the field of solar photovoltaic equipment, can solve the problems of not having or weakening the "light trap effect", weakly absorbed light cannot produce scattering effect, etc.
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[0011] Such as figure 1 As shown, the first step of the present invention is to form an ultra-thin silicon layer 5 containing nanoparticles on the transparent conductive front electrode (such as tin oxide) 2 deposited on the glass substrate 1, and its average thickness does not exceed 15 nanometers. The surface 57 has a structure similar to that of the transparent conductive front electrode 2. The inducing layer is formed using PECVD under conditions including the following parameters: the substrate temperature does not exceed 200°C, and the power density of DC or AC excitation is not less than 100mW / cm 2 , Use silane as the main source gas mixture, the pressure in the reaction chamber is not less than 1mbar, the distance between positive and negative parallel electrodes is not less than 1.5 cm, and the deposition time is not more than 25 seconds. Subsequently, the second step is to use the usual PECVD method on the inducing layer to obtain one or several p-i-n photovoltaic units...
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