System for acquisition and processing of x-ray diffraction data

A data acquisition and processing system technology, applied in the direction of material analysis using radiation diffraction, optical radiation measurement, radiation pyrometry, etc., can solve the problems that cannot meet the requirements of engineering microcomputerized automatic control, cannot carry out on-line automatic testing, and cannot adapt , to achieve the effect of improving work efficiency and quality, high positioning accuracy, and high analysis efficiency
CN101256159AInactive Publication Date: 2008-09-03GENERAL RESEARCH INSTITUTE FOR NONFERROUS METALS BEIJNG
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Patent Information

Authority / Receiving Office
CN · China
Current Assignee / Owner
GENERAL RESEARCH INSTITUTE FOR NONFERROUS METALS BEIJNG
Publication Date
2008-09-03
Estimated Expiration
Not applicable · inactive patent

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Abstract

The invention discloses an x ray diffraction data acquisition and process system, which includes a computer, a control circuit, an angle measurer, a detector, a scaler, a signal treating system as well as an X ray window, the computer, the signal processing system, the X ray window, the angle measurer are connected with the control circuit; the detector is arranged on the angle measurer, which is connected with the signal processing system; the scaler is arranged on the angle measurer, which is connected with the control circuit. The control circuit includes a single-chip, which is used on a accounting device for recoding x ray photon numbers and other devices. The x ray diffraction data acquisition and process system provided by the invention uses a stepping motor with high precision, and has fine controllability, high positioning accuracy and the functions of test and analysis of routine x ray diffraction, because the control circuit is added, consequently the real-time microcomputer test controlled by the computer is realized in the system, which improves the work efficiency and the quality.
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Description

technical field

[0001] The invention relates to an optical measuring instrument, in particular to an X-ray diffraction data collection and processing system. Background technique

[0002] X-ray diffractometer is an important large-scale test and analysis instrument in material research and development. The well-known APD-10 X-ray diffractometer is a product of Philips in the Netherlands in the 1970s, which includes a high-voltage generator, a horizontal goniometer, a detector, a scaler, an AC motor, a clutch and a texture goniometer and other devices. The horizontal goniometer is driven by an AC motor and can only scan continuously. Although the θ-axis and 2θ-axis can be rotated automatically or manually controlled by the clutch, this measurement method still cannot meet the needs of modern structural analysis. The rotation of the χ-axis and φ-axis of the texture goniometer is driven by an AC motor at the same time. The collection of pole figure data can only be collected ...

Claims

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