Method for preparing nano CMOS integrated circuit by micro process
An integrated circuit, micron-scale technology, applied in the manufacturing of circuits, electrical components, semiconductor/solid-state devices, etc., can solve the problems of rising production costs, restricting the development of the semiconductor industry, waste of resources and energy, etc., to improve manufacturing capacity and achieve leapfrogging development, the effect of small conduction channel
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- Publication Date
- 2010-06-02
- Estimated Expiration
- Not applicable · inactive patent
Smart Images
Figure 1 Figure 2 Figure 3
Abstract
Description
technical field
[0001] The invention belongs to the technical field of semiconductor integrated circuits, and in particular relates to a method for manufacturing nanoscale Si integrated circuits by using the existing micron-scale Si integrated circuit manufacturing process. Background technique
[0002] Information technology is the core technology of the national economy. It serves all fields of the national economy. Microelectronics technology is the key to information technology, and integrated circuits are the key among the keys. Since the advent of integrated circuits in 1958, they have developed at an astonishing speed. They have become the core of information science and technology, the cornerstone of national economic development and national defense construction, and have had a huge impact on world politics, economy and culture. As the fastest-growing, most influential, and most widely used technology in human history, integrated circuits have become an important in...
Examples
Embodiment 1
[0030] Embodiment 1: prepare the CMOS integrated circuit that conduction channel is 45nm on Si substrate, concrete steps are as follows:
[0031] Step 1, deposit a masking layer, such as figure 2 (a) shown.
[0032] (1a) Select the crystal orientation as and the doping concentration as 10 15 cm -3 Left and right p-type Si substrate sheets 1;
[0033] (1b) Thermally oxidize a layer of SiO with a thickness of 20 nm on the substrate 2 buffer layer 2;
[0034] (1c) on SiO 2 A 100nm-thick SiN layer 3 is deposited on the buffer layer by low-pressure chemical vapor deposition (LPCVD) for masking of well implantation.
[0035] Step 2, forming a well region, such as figure 2 (b) shown.
[0036] (2a) Photoetching the P well region 4 and the N well region 5 on the SiN layer 3 according to the phase sequence;
[0037] (2b) Boron is implanted in the P well region to form a p-type region, and SiO is thermally oxidized on the surface of the P well region 2 , while advancing the ...
Embodiment 2
[0066] Embodiment 2: prepare the CMOS integrated circuit that conduction channel is 65nm on SOI substrate, concrete steps are as follows:
[0067] Step 1, deposit a masking layer, such as figure 2 (a) shown.
[0068] (1a) Select the crystal orientation as and the doping concentration as 10 15 cm -3 left and right p-type SOI substrates 1;
[0069] (1b) Thermally oxidize a layer of SiO with a thickness of 40 nm on the substrate 2 buffer layer 2;
[0070] (1c) on SiO 2 A 150nm-thick SiN layer 3 is deposited on the buffer layer by means of APCVD for the masking of the implantation in the well region.
[0071] Step 2, forming a well region, such as figure 2 (b) shown.
[0072] (2a) Photoetching the P well region 4 and the N well region 5 on the SiN layer 3 according to the phase sequence;
[0073] (2b) Boron is implanted in the P well region to form a p-type region, and SiO is thermally oxidized on the surface of the P well region 2 , while advancing the P well, formin...
Embodiment 3
[0102] Embodiment 3: prepare the CMOS integrated circuit that conduction channel is 90nm on Si substrate, concrete steps are as follows:
[0103] Step 1, deposit a masking layer, such as figure 2 (a) shown.
[0104] (1a) Select the crystal orientation as and the doping concentration as 10 15 cm -3 Left and right p-type Si substrate sheets 1;
[0105] (1b) Thermally oxidize a layer of SiO with a thickness of 60 nm on the substrate 2 buffer layer 2;
[0106] (1c) on SiO 2 A 200nm thick SiN layer 3 is deposited on the buffer layer by plasma-enhanced chemical vapor deposition (PECVD) for the masking of well implantation.
[0107] Step 2, forming a well region, such as figure 2 (b) shown.
[0108] (2a) Photoetching the P well region 4 and the N well region 5 on the SiN layer 3 according to the phase sequence;
[0109] (2b) Boron is implanted in the P well region to form a p-type region, and SiO is thermally oxidized on the surface of the P well region 2 , while advanci...