Film forming method and film forming apparatus
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- TOKYO ELECTRON LTD
- Publication Date
- 2010-03-10
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Abstract
Description
technical field
[0001] The present invention relates to a film-forming method and a film-forming apparatus for forming a titanium film or a titanium nitride film on an object to be processed such as a semiconductor wafer, and more particularly to a film-forming method and a film-forming apparatus for suppressing generation of particles. Background technique
[0002] Generally, in order to manufacture a semiconductor integrated circuit, film formation, pattern etching, etc. are repeated on a substrate such as a semiconductor wafer to form a plurality of desired elements. In addition, in a semiconductor integrated circuit, it is of course necessary to use a low-resistance metal as a wiring for connecting each element therein, as a contact metal for realizing electrical contact with each element, or as a barrier metal used as a countermeasure against Si sucking out of the substrate. For the material, it is also necessary to use a material with excellent corrosion resistance. ...