Unlock instant, AI-driven research and patent intelligence for your innovation.

Amorphous silicon film controllable iso-epitaxial growth method

An amorphous silicon thin film, homoepitaxial technology, applied in electrical components, semiconductor/solid-state device manufacturing, circuits, etc., can solve the problems of affecting battery efficiency, difficult to control the crystal orientation of grains, and poor controllability of the crystallization process. Crystallinity controllable effect

Inactive Publication Date: 2011-11-30
NANTONG UNIVERSITY
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, at present, there are two main ways of heating the film by laser: 1) The short-wave pulse laser is absorbed by the amorphous silicon film, and the film itself generates heat to form a polycrystalline film. The crystal orientation is not easy to control and a large number of interface states will be formed on the interface with the substrate, which will affect the efficiency of the battery
2) The long-wave continuous laser passes through the film to heat the substrate, and then transfers the heat energy to the amorphous silicon film, so that the film undergoes epitaxial crystal growth, but the crystallization process is poorly controllable

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Amorphous silicon film controllable iso-epitaxial growth method
  • Amorphous silicon film controllable iso-epitaxial growth method
  • Amorphous silicon film controllable iso-epitaxial growth method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0023] In this embodiment, an amorphous silicon thin film is used as a (111) single crystal silicon substrate, and the crystal size required for epitaxial growth is between 1 nm and 50 nm, which will be adjusted by the duty ratio.

[0024] First place the silicon chip 4 with the amorphous silicon thin film of single crystal made through chemical vapor deposition figure 1 Inside the cavity of the protective container 1 shown. Nitrogen protection is introduced again to prevent the oxidation of the amorphous silicon film. Then use a long-wave YAG laser to perform pulse laser crystallization annealing on the film sample. The wavelength of the long-wave is 1.00-1.10 microns, preferably 1.06 microns. Choose the pulse frequency as 4Hz, 8Hz, 10Hz, 12Hz and 15Hz respectively, keep the output power of the laser at 450w, choose the pulse width of 2ms, and the action time is 30-90s. During operation, the pulse laser at the focal point cannot be used, adjust the spot size, and form a 1×1...

Embodiment 2

[0029] In this embodiment, an amorphous silicon film on a polysilicon substrate is used, and the crystal size required for epitaxial growth is 1-50 nm, which will be adjusted by the duty ratio.

[0030] First the above-mentioned silicon chip 4 with polycrystalline amorphous silicon thin film that chemical vapor deposition makes is placed on figure 1 Inside the cavity of the protective container 1 shown. Argon gas is then introduced to protect the amorphous silicon film from oxidation. Then, pulse laser crystallization annealing is carried out by exciting the sample with long-wave YAG, and the wavelength of the long-wave is 1.06 microns. The frequencies of 4Hz, 8Hz, 10Hz, 12Hz, 15Hz, 20Hz and 25Hz were respectively applied to anneal the amorphous silicon thin film on the polycrystalline silicon substrate. Keep the output power of the laser at 450w unchanged, select a laser pulse with a wavelength of 1.06μm and a pulse width of 2ms, and a laser spot of 1×1cm 2 . The duty cyc...

Embodiment 3

[0036] This embodiment also uses an amorphous silicon thin film on a polycrystalline silicon substrate, and the crystal size of the epitaxial growth that requires a duty cycle close to that will be adjusted by the duty cycle.

[0037] Same as the above-mentioned two embodiments, first place the above-mentioned amorphous silicon thin film figure 1 In a container with protective gas (such as nitrogen) as shown. Apply YAG laser, keep its output power 450w constant, choose laser frequency 15Hz constant, change pulse width, respectively 0.5ms, 1ms, 1.5ms, 2ms, anneal the amorphous silicon film on the polysilicon substrate. After epitaxial growth, the crystal performance of the film was tested by XRD machine, and the diffraction pattern is as follows Figure 4 As shown, it can be seen from the figure that for different pulse widths, the intensity of the XRD diffraction peaks gradually decreases. As the pulse width changes, the duty cycle is 1 / 133, 1 / 66, 1 / 44, 1 / 33 respectively.

...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to an amorphous silicon film controllable iso-epitaxial growth method which is carried by using long-wave pulse laser technology. The method comprises the following steps: firstly, placing an amorphous silicon film with a monocrystal or polycrystal substrate prepared by chemical vapor deposition into a protective container with inert gas; then, using pulse laser with the wave length between 1.00 to 1.10 micrometers, and regulating the light spot size so that the pulse laser can generate a light spot with the size of 1*1 cm<2> in the positive defocusing amount direction to be used for heating the film for carrying crystallization annealing; and reaching the crystal grain size requirements of the film epitaxial growth through regulating the ratio of the pulse width to the heating time, i.e. the duty ratio under the condition of maintaining the output power unchanged. The invention controls the crystal grain growth in the film through regulating the pulse duty ratio. The method of the invention can be applied to the controllable epitaxial growth of the silicon, and can also be applied to the fast controllable epitaxial growth of materials such as ZnO and the like. The film growing by using the method of the invention can be used for solar energy industry, and can also be used for the manufacture of integrated circuits and electronic elements.

Description

technical field [0001] The invention relates to the modification technology of the amorphous silicon thin film material, in particular to a method for controlling the homogeneous epitaxial growth of the amorphous silicon thin film by using the long-wave pulse laser technology. Background technique [0002] Amorphous silicon is also known as amorphous silicon, and its atomic distribution does not have periodicity and long-term program. Therefore, the density of structural defects and dangling bonds in amorphous silicon materials is high. When carriers are transported in it, they are affected. These defects and the effect of dangling bonds have a higher recombination rate, which reduces the ability of amorphous silicon to transmit current. Solar cells made of amorphous silicon materials have many unfavorable physical changes such as photodegradation, Fermi level shifting to the center of the band gap, reduced carrier lifetime, reduced diffusion length, and increased defects. ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/268
Inventor 花国然王强戴丽娟张华罗辰顾江陈宏
Owner NANTONG UNIVERSITY
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More