System for measuring temperature in thyristor in real time

Abstract

The invention relates to a real-time temperature measurement system in a thyristor shell, which includes a fiber grating temperature sensor. The fiber grating temperature sensor adopts an optical fiber made of quartz glass, and a grating is etched on the optical fiber. Each grating is the core of the measurement system. The measuring point is used to realize the temperature distribution of the thyristor molybdenum sheet layer with multiple gratings simultaneously; the molybdenum sheet of the thyristor is provided with a slot for accommodating the optical fiber, and the ceramic ring of the thyristor is provided with an opening, and the optical fiber passes through the opening and passes through multiple The mode fiber is connected with the demodulator, and the demodulator demodulates the reflected wavelength of the reflected light from the fiber grating temperature sensor into a temperature signal, so as to obtain the real-time information of the temperature in the copper shell of the crystal gate, and the demodulator converts the demodulated The data is transmitted to the background computer through the network cable. The measurement system has the advantages of strong stability, high reliability, strong stability, good linearity, and small error. The measurement range is -40°C to 310°C, and the maximum error is 1.68%, which can meet the test requirements of various thyristor converter valves. .

Description

technical field [0001] The invention belongs to the field of power electronic systems, and in particular relates to a real-time temperature measurement system in a thyristor shell. Background technique [0002] Since the thyristor was born in 1956, it has been developing in the direction of high voltage and high current. It is divided into Electrically Triggered Thyristor (ETT), Light-Triggered Thyristor (Light-Triggered Thyristor, LTT), and is widely used in HVDC , SVC, TCSC, TSC and other fields. The thyristor converter valve is the core component of the system operation. During the opening process, if it is subjected to a fault (surge) current, the current rise rate is very large, but the increase in the expansion speed of single crystal silicon is not obvious and uneven. Therefore, It will form a high current density in the conduction part and cause a sharp rise in the local junction temperature, which will eventually cause the thyristor to burn out; during the conducti...

AI Technical Summary

Problems solved by technology

Therefore, there is an urgent need for a measurement system that can measure the real-time temperature in the thyristor. However, the measurement methods in this application field at home and abroad are still blank.

Images