N-type czochralski silicon with uniform doping resistivity and preparation method thereof
A technology of Czochralski silicon and resistivity, applied in the field of solar cell materials, can solve the problems of low utilization rate of high-efficiency solar cell materials, large axial variation range of resistivity of N-type Czochralski silicon single crystal, etc., and achieve easy large-scale application , Improve the utilization rate, reduce the effect of manufacturing cost
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Embodiment 1
[0022] First put 11.05mg of phosphorus and 361.81mg of gallium into the bottom of the quartz crucible, then put 50kg of high-purity electronic grade polysilicon into the quartz crucible; under the protection of argon, melt the polysilicon at 1410°C to melt the phosphorus and gallium into the polysilicon In the solution, adjust the crystal growth parameters (pot rotation 10r / min, crystal rotation 20r / min, protective gas flow rate 100torr), and grow a Czochralski silicon single crystal with a diameter of 150mm at a growth rate of 1.2mm / min. Samples were taken at different parts of the grown crystal, and the axial distribution of the resistivity of the grown crystal was tested by the four-probe method, as shown in the attached figure 1 shown. It can be seen that the resistivity of the whole crystal is distributed between 1.0-2.0Ω.cm. As a result, the utilization of silicon material is increased by 22% relative to the crystal without gallium doping compensation. The efficiency o...
Embodiment 2
[0024] First put 9.47mg of phosphorus and 517.66mg of gallium into the bottom of the quartz crucible, and then put 50kg of metallurgical grade compensation silicon material (containing 0.49mg of boron and 6.31mg of phosphorus in total) into the quartz crucible; under the protection of argon , melt the polysilicon material at 1410°C, melt phosphorus and gallium into the polysilicon solution, adjust the crystal growth parameters (pot rotation 15r / min, crystal rotation 37r / min, protective gas flow rate 200torr), and grow at a growth rate of 1.5mm / min A Czochralski silicon single crystal with a diameter of 150 mm. Samples were taken at different parts of the grown crystal, and the axial distribution of the resistivity of the grown crystal was tested by the four-probe method, as shown in the attached figure 2 shown. It can be seen that the resistivity of the whole crystal is distributed between 1.0-2.0Ω.cm. As a result, the utilization of silicon material is increased by 30% rel...
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