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Bar-type phase diaphragm and 4f phase-concerned nonlinear imaging system and nonlinear refractive index metering method based on same

A phase diaphragm and imaging system technology, applied in the optical field, can solve the problems of low measurement accuracy, difficult wide-band optical nonlinear measurement, laser pulse beam quality and high energy stability requirements, so as to improve system measurement accuracy and reduce production cost. The effect of process difficulty and beam quality reduction

Inactive Publication Date: 2012-08-15
HARBIN INST OF TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] The purpose of the present invention is to solve the problem of low measurement accuracy caused by the complex manufacturing process of the circular phase aperture, the irregular shape of the phase object, and the burrs on the edge; , high beam quality and energy stability in space, it is difficult to realize the problem of wide-band optical nonlinear measurement; 4f phase coherent nonlinear imaging system will cause irreversible damage to nonlinear samples due to continuous high-intensity irradiation near the focal point

Method used

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  • Bar-type phase diaphragm and 4f phase-concerned nonlinear imaging system and nonlinear refractive index metering method based on same
  • Bar-type phase diaphragm and 4f phase-concerned nonlinear imaging system and nonlinear refractive index metering method based on same
  • Bar-type phase diaphragm and 4f phase-concerned nonlinear imaging system and nonlinear refractive index metering method based on same

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specific Embodiment approach 1

[0019] Specific implementation mode 1. Combination figure 1 Describe this embodiment in detail, the bar-shaped phase diaphragm 4 described in this embodiment is a circular glass plate 4-1, and an annular opaque region is arranged on the circular glass plate 4-1. The center of circle of opaque area is the center of circle of circular glass sheet 4-1, and the outer diameter of this annular opaque area is equal to the diameter of circular glass sheet 4-1, and the radius of this annular opaque area is R a , at radius R a A strip-shaped transparent medium film is arranged in the transparent area, and the transparent medium film runs through the entire transparent area. The transparent medium film is a phase object 4-2, and the two sides of the strip-shaped transparent medium film are symmetrically distributed on The two sides of a diameter of the circular glass sheet 4-1 are parallel to each other, and the distance between the two sides of the strip-shaped transparent medium film ...

specific Embodiment approach 2

[0020] Embodiment 2. The difference between this embodiment and Embodiment 1 is that the inner radius R of the circular opaque region is a The distance between the two sides of the strip-shaped transparent dielectric film 2R p The optimal relationship between them is: 2R p / R a ∈(0.16, 0.18).

specific Embodiment approach 3

[0021] Specific embodiment three, combine image 3This embodiment is described in detail. What this embodiment describes is the 4f phase coherent nonlinear imaging system using the strip phase diaphragm described in the first embodiment. It consists of a half-wave plate 1, a polarizing prism 2, an expansion A beam splitter 3, a strip phase diaphragm 4, an image sensor 14, an energy reference system and a 4f imaging system, wherein the energy reference system consists of a beam splitter 5, a second total mirror 10, a first neutral filter 11. The third convex lens 12, the third total reflection mirror 13 and the first total reflection mirror 9;

[0022] The 4f imaging system is made up of the first convex lens 6 and the second convex lens 8, the first convex lens 6 and the second convex lens 8 are coaxial and confocal, wherein the first convex lens 6 is the incident lens of the 4f imaging system, and the second convex lens 8 is Exit lens of 4f imaging system;

[0023] The stri...

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Abstract

The invention relates to a bar-type phase diaphragm and a 4f phase-concerned nonlinear imaging system and a nonlinear refractive index metering method based on the system, relating to the technical field of optics, and solving problems that a manufacturing process of a circular phase object is complex, requirements on light beams are high during the measurement of a Z scanning system, samples are broken easily due to repeated irradiation on a focus, the sensitivity is low and the error is large. The bar-type phase diaphragm consists of a bar-type phase object and a circular diaphragm. The 4f phase-concerned nonlinear imaging system of the bar-type phase diaphragm consists of a half wave plate, a polarization prism, a beam expander, a bar-type phase diaphragm, an image sensor, an energy referring system and a 4f imaging system. The energy referring system consists of a beam splitter, a second total-reflection mirror, a middle filtering sheet, a third convex lens, a third total-reflection mirror and a first total-reflection mirror. Two convex lenses of the 4f imaging system are coaxially and confocally arranged, the first convex lens is an incidence lens, and the second convex lens is an emergence lens. The 4f phase-concerned nonlinear imaging system disclosed by the invention is applied to the field of optical communication, optical information process and the like.

Description

technical field [0001] The invention relates to a phase diaphragm, an optical imaging system and the application technology of the system, belonging to the field of optical technology. Background technique [0002] With the rapid development of fields such as optical communication and optical information processing, the importance of research on nonlinear optical materials has become increasingly prominent. The realization of functions such as optical logic, optical memory, optical triode, optical switch and phase conjugation mainly depends on the progress of research on nonlinear optical materials. Optical nonlinear measurement technology is one of the key technologies for studying nonlinear optical materials. The 4f phase coherent nonlinear imaging system to be used here (G.Boudebs and S.Cherukulappurath, "Nonlinear optical measurements using a 4f coherent imaging system with phase object", Phys.Rev.A, 69, 053813(1996)) is An innovative method for measuring nonlinear ref...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G02B5/30G02B27/28G01N21/41
Inventor 石光宋瑛林聂仲泉李中国税敏金肖杨昆王玉晓张学如
Owner HARBIN INST OF TECH
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