Measurement control system for diameter of Czochralski grown monocrystalline germanium

A technology of control system and diameter measurement, which is applied in the directions of single crystal growth, crystal growth, self-melting liquid pulling method, etc., can solve the problem that the aperture signal of germanium solid-liquid interface cannot be detected, and the automatic control unit cannot grow germanium in equal diameter Automatic control and other issues to achieve the effect of reducing labor intensity, reducing the amount of data transmission, and avoiding repeated design and investment

Inactive Publication Date: 2013-02-06
YUNNAN KIRO CH PHOTONICS
View PDF3 Cites 10 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] Aiming at the deficiency that the existing Czochralski single crystal diameter control system cannot detect the aperture signal of the germanium-solid-liquid interface using an Ircon probe, resulting in the inability to use an automatic control unit to automatically control the equal-diameter

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Measurement control system for diameter of Czochralski grown monocrystalline germanium
  • Measurement control system for diameter of Czochralski grown monocrystalline germanium
  • Measurement control system for diameter of Czochralski grown monocrystalline germanium

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0023] The present invention will be further described in detail through the embodiments below in conjunction with the accompanying drawings.

[0024] Czochralski germanium single crystal diameter measurement and control system described in the present invention (such as image 3 shown), the system has a CCD camera 4, an image processing device 5 and an automatic control unit 6. The CCD camera is placed at the position of the observation window of the single crystal furnace, and the position of the aperture 3 at the solid-liquid interface is found (such as Figure 4 shown), synchronously collect the image data of equal-diameter growth of germanium single crystal, and transmit the image data to the image processing device 5; the image processing device recognizes the image data of the solid-liquid interface aperture 17 detected by the CCD camera, and the aperture 17 is detected by the computer. intersects the three preset lines 18 (eg Figure 5 shown), save the position inform...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

A measurement control system for diameter of Czochralski grown monocrystalline germanium is characterized by comprising a camera, an image processor and an automatic control unit, the camera acquires images of equal-diameter growth of monocrystalline germanium, an image processor recognizes the position of an aperture of a solid-liquid interface and calculates curvature radius of the aperture of the solid-liquid interface to allow for equal-diameter growth of monocrystalline germanium by the automatic control unit. The measurement control system for diameter of Czochralski grown monocrystalline germanium has the advantages that an image processing card only analyzes an aperture part of acquired images, data transmission quantity is reduced, and the requirement of the system for hardware performance is reduced. Complex mapping from ellipse to circle is not required, and equal-diameter control can be achieved according to a change rule of the curvature radius only by acquiring the curvature radius of a specified point. The camera can integrally transmit the acquired growth images of monocrystalline germanium for image processing and analyzing, and accordingly multiple devices are convenient to monitor in real time by a production operator and labor strength of growth of monocrystalline germanium is lowered. The existing devices can be utilized to the maximum limit, and repeated design and investment of an electrical control system are avoided.

Description

technical field [0001] The invention belongs to the technical field of on-line control of the single crystal diameter based on an embedded system in the Czochralski single crystal process. Background technique [0002] Germanium single crystal is an important material in the infrared field and semiconductor industry. At present, the Czochralski method (Czochralski, CZ method) is an important method for manufacturing germanium single crystal. In this method, by designing a reasonable thermal field, the polycrystalline germanium material is put into the crucible, and a certain temperature and pressure environment are maintained. Immerse the seed crystal in the solution, and in a suitable thermal field environment, the germanium atoms in the solution will continue to arrange along the original germanium atom arrangement structure of the seed crystal at the solid-liquid interface between the seed crystal and the melt, and slowly lift the seed crystal , then a single crystal con...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): C30B15/26
Inventor 赵逸群张二平贾钰超程海娟李洪兵姜杰陈骥刘建红莫文聪许红
Owner YUNNAN KIRO CH PHOTONICS
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products