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Vertical-type capacitor structure and manufacturing method thereof

A technology of capacitor structure and manufacturing method, which is applied in the direction of circuits, electrical components, and electrical solid devices, and can solve the problems of large resistance, high-frequency channels of multi-layer chips in three-dimensional integrated circuits, and the inability to charge groove surfaces. Achieve high capacitance density, save layout area, and improve integration

Inactive Publication Date: 2013-10-09
BEIJING INSTITUTE OF TECHNOLOGYGY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The existing trench capacitor structure cannot be completely called a vertical capacitor. Although the capacitor area is expanded in the vertical substrate method, the upper and lower electrode plates are still similar to the flat capacitor, and the electrode plate filling material is mostly polysilicon. , the resistance value is large, and the surface of the groove cannot be fully charged
On the other hand, the existing deep trench capacitor structure is mostly used for memory, and has not been applied to high-frequency channels between multi-layer chips in three-dimensional integrated circuits.

Method used

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  • Vertical-type capacitor structure and manufacturing method thereof
  • Vertical-type capacitor structure and manufacturing method thereof
  • Vertical-type capacitor structure and manufacturing method thereof

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specific Embodiment 1

[0046] Specific embodiment 1: vertical shape capacitor structure and manufacturing method thereof.

[0047] Such as figure 2 As shown, deep reactive ion etching technology is used to etch a circular deep groove S2 on the wafer substrate S1. The width of the deep trench is 5-10 microns; the length of the deep trench is not strictly limited, and can be 5-200 microns; the depth of the deep trench is less than the thickness of the wafer substrate, and can be 60-500 microns; the shape of the deep trench is One of a shape, a circular ring, or a polygonal ring.

[0048] Such as image 3 As shown, the insulating layer 101 silicon dioxide is deposited on the inner wall of the deep trench by plasma enhanced chemical vapor deposition; the copper seed layer is deposited by sputtering technology, and the thickness of the copper layer is increased by electroplating to form a conductive layer 102. For inner and outer electrode plates. The thickness of the copper seed layer is not strictly...

specific Embodiment 2

[0051] Specific embodiment 2: vertical strip capacitor structure and manufacturing method thereof.

[0052] Such as Image 6 As shown, in this embodiment, the same manufacturing method as in Embodiment 1 is used to fabricate two strip-shaped deep groove structures S22 side by side. The production range of the length of the deep trench under the existing technology is 5-200 microns; the width of the deep trench in this embodiment is 3-5 microns; the depth of the deep trench is less than the thickness of the wafer substrate S21, which can be 60-500 microns; The distance between the deep grooves is 2-5 microns; the shape of the deep grooves is a rectangle or an "S" polygon.

[0053] Such as Figure 7 As shown, in this embodiment, the same manufacturing method as in Embodiment 1 is used to deposit the insulating layer 201 and deposit the conductive layer 202 in the deep trench S21 until the deep trench is filled.

[0054] Such as Figure 8 As shown, the silicon between the con...

specific Embodiment 3

[0057] Specific embodiment 3: vertical strip capacitor interdigitated parallel structure.

[0058] Such as Figure 11 As shown, this embodiment adopts the manufacturing method in Embodiment 2 to manufacture three vertical strip capacitors on the same wafer substrate, wherein 301 is an insulating layer, 302 is a conductive layer, and 303 is a dielectric layer, and then use The surface interconnection process forms the interdigitated electrodes S32 to form a parallel capacitor structure.

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Abstract

The invention relates to a vertical-type capacitor structure and a manufacturing method of the vertical-type capacitor structure, and belongs to the technical field of micro-electronic passive devices. The vertical-type capacitor structure structurally and specifically comprises a deep-groove structure, insulating layers, conducting layers and a dielectric layer, wherein the deep-groove structure is located inside a wafer substrate, the insulating layers and the conducting layers are sequentially deposited on the inner side wall of a deep groove, and the dielectric layer is filled between the conducting layers. The insulating layers, the conducting layers, the dielectric layer and the deep groove are the same in height. On the basis of the principle that the area of a capacitor is expanded in the direction perpendicular to the substrate, the area of an plate electrode in the perpendicular direction is utilized, the processes such as sputtering and electroplating are adopted to manufacture a metal plate electrode, and the plate electrode is made of low electrical resistivity materials, like metal. With the combination of a silicon through hole technology, the vertical-type capacitor with a large depth-to-width ratio is achieved. With the combination of a substrate back thinning technology, the vertical-type capacitor structure penetrates through the substrate, the vertical-type capacitor structure can be used as a high-frequency channel between multi-layer chips, the area of the plate can be greatly saved, and the integration level of an integrated circuit is improved.

Description

technical field [0001] The invention relates to a vertical capacitor structure and a manufacturing method thereof, belonging to the technical field of microelectronic passive devices. Background technique [0002] Capacitors are passive devices with the function of storing charges, and have electrical functions such as decoupling, switching noise suppression, bypass filtering, AC / DC conversion, and signal isolation. It has important functions both in discrete device circuits and integrated circuits. Capacitance values ​​typically vary on the order of picofarads (pF) to microfarads (μF). [0003] In the development of integrated circuits for more than 40 years, the feature size of transistors has been continuously reduced following Moore's Law, and the functions and performance of integrated circuits have been continuously improved. However, the size of the capacitor cannot be effectively reduced due to the limitation of the dielectric material, and it is currently much lar...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L23/64H01L21/02
Inventor 丁英涛高巍王士伟陈倩文
Owner BEIJING INSTITUTE OF TECHNOLOGYGY
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