Preparation method of copper nanowire arrays with porous structure and film conductivity measuring method thereof
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- 杭州知创新材料技术有限公司
- Publication Date
- 2014-01-15
- Estimated Expiration
- Not applicable · inactive patent
Smart Images
Figure 1 Figure 2 Figure 3
Abstract
Description
technical field
[0001] The invention relates to a method for preparing a copper nanowire array on an aluminum nitride substrate by using a magnetron sputtering method at room temperature. A method for testing the electrical conductivity of a copper nanowire array film by using a four-probe method. Background technique
[0002] Nanomaterials can be widely used in chemical industry, electronics, textile, light industry, military, medical and other fields, among which the most promising is the electronics industry. One-dimensional structured nanomaterials (such as nanowires, nanorods, and nanotubes, etc.) are currently a hot topic in nanomaterials research. One-dimensional metal nanomaterials are a good combination of the characteristics of one-dimensional nanomaterials and metals themselves, and also have excellent physical and chemical properties. At present, one-dimensional metal nanomaterials have attracted much attention because of their potential applications in ultra-h...