Manufacturing method of substrate structure used for III-V group nitride growth
A technology of substrate structure and manufacturing method, applied in electrical components, circuits, semiconductor devices, etc., can solve the problems of complex process, crystal defects, affecting the brightness of light-emitting diodes, etc.
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Embodiment 1
[0038] Such as Figure 1 to Figure 7 As shown, this embodiment provides a method for manufacturing a substrate structure for growing III-V nitrides, which at least includes the following steps:
[0039] Such as Figure 1 ~ Figure 2 As shown, step 1) is firstly performed, a growth substrate 101 is provided, and a buffer layer 102 for subsequent growth of a light-emitting epitaxial structure is formed on the surface of the growth substrate 101 .
[0040]As an example, the material of the growth substrate 101 is one of sapphire, SiC, Si and ZnO. In this embodiment, the growth substrate 101 is a flat sapphire substrate with a flat surface. The buffer layer 102 is low-temperature Al prepared by low-temperature chemical vapor deposition. x Ga 1-x N layer (0≤X≤0.5), preferably low temperature Al x Ga 1-x For N layers (0≤X≤0.2), the temperature range for preparation is 450-700°C. In this example, the low temperature Al x Ga 1-x The preparation temperature of the N layer (0≤X≤0...
Embodiment 2
[0059] Such as Figure 1 to Figure 8 As shown, this embodiment provides a method for manufacturing a substrate structure for the growth of III-V nitrides, the basic steps of which are as in Embodiment 1, wherein the buffer layer 102 is AlN prepared by sputtering layer, the crystal orientation or main crystal orientation of the AlN layer is (0001) orientation. Compared to low temperature Al x Ga 1-x N layer, the advantage of sputtering AlN layer preparation is strong controllability of thickness, high degree of crystal orientation, and it is also conducive to the nucleation and growth of light-emitting epitaxial structures (especially GaN-based light-emitting epitaxial structures).
[0060] As another embodiment, such as Figure 1 to Figure 8 As shown, the buffer layer 102 can also be a BN material layer prepared by methods such as sputtering.
[0061] As mentioned above, the present invention provides a method for manufacturing a substrate structure for the growth of III-V...
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