Amorphous oxide film used as channel layer of thin film transistor and preparation method thereof
A technology of thin-film transistors and amorphous oxides, which is applied in the manufacture of transistors, semiconductor/solid-state devices, coatings, etc., can solve the problems of high cost in the TFT industry, accelerated In consumption, and mining difficulties, etc., to meet high-definition, The effect of increasing the aperture ratio and simplifying the process
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Embodiment 1
[0034] (1) The weighed Zn(NO 3 ) 2 ·6H 2 O, Al(NO 3 ) 3 9H 2 O and SnCl 2 +NH 4 NO 3 Dissolve in dimethoxyethanol + acetylacetone + 14.5M ammonia solution to form a precursor solution with a concentration of 0.2M, stir at 30°C for 24h, and filter according to Zn:Al:Sn=4:0.5: 7 proportions mixed evenly, aged for 24 hours;
[0035] (2) the solution obtained after step (1) is aged in n ++ Si / 150nmSiO 2 The substrate was spin-coated to form a film. The spin-coating conditions were: the rotation speed was 4000rpm, the spin-coating time was 35s, and the spin-coating was performed 4 times. Annealing was performed after each spin-coating. The temperature of the annealing treatment was 300°C, and the annealing time was 30min. The molecular formula of the resulting film is: Zn 4 Al x sn 7 o 1.5X+18 , where: x=0.5.
[0036] (3) The film thickness, surface roughness, carrier concentration, and transmission spectrum in the ultraviolet-visible region were tested for the prepa...
Embodiment 2
[0040] (1) The weighed Zn(NO 3 ) 2 ·6H 2 O and SnCl 2 +NH 4 NO 3 Dissolve in dimethoxyethanol + acetylacetone + 14.5M ammonia solution to form a precursor solution with a concentration of 0.2M, stir at room temperature for 12 hours, filter and mix evenly according to the ratio of Zn:Sn=4:7, Aging for 12h;
[0041] (2) the solution obtained after step (1) is aged in n ++ Si / 150nmSiO 2 The substrate was spin-coated to form a film. The spin-coating conditions were: the rotation speed was 4500rpm, the spin-coating time was 25s, and the spin-coating was performed 5 times. After each spin-coating, annealing treatment was performed. The temperature of the annealing treatment was 400°C, and the annealing time was 50min. The molecular formula of the resulting film is: Zn 4 Al x sn 7 o 1.5X+18 , where: x=0.
[0042] (3) The film thickness, surface roughness, carrier concentration, and transmission spectrum in the ultraviolet-visible region were tested for the prepared film. ...
Embodiment 3
[0046] (1) The weighed Zn(NO 3 ) 2 ·6H 2 O, Al(NO 3 ) 3 9H 2 O and SnCl 2 +NH 4 NO 3 Dissolve in dimethoxyethanol + acetylacetone + 14.5M ammonia solution to form a precursor solution with a concentration of 0.2M, stir at 50°C for 6h, and filter according to Zn:Al:Sn=4:0.25: 7 proportions mixed evenly, aged for 6 hours;
[0047] (2) the solution obtained after step (1) is aged in n ++ Si / 150nmSiO 2 The substrate was spin-coated to form a film. The spin-coating conditions were: the rotation speed was 3500rpm, the spin-coating time was 40s, and the spin-coating was performed 4 times. Annealing was performed after each spin-coating. The temperature of the annealing treatment was 400°C, and the annealing time was 60min. The molecular formula of the resulting film is: Zn 4 Al x sn 7 o 1.5X+18 Where: x=0.25.
[0048] (3) The film thickness, surface roughness, carrier concentration, and transmission spectrum in the ultraviolet-visible region were tested for the prepare...
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