Epitaxial wafer of light emitting diode and manufacturing method thereof
A technology of light-emitting diodes and epitaxial wafers, which is applied in the direction of electrical components, circuits, semiconductor devices, etc., can solve the problem that the light efficiency of high-power chips is not large, and achieve the reduction of electron spillage, obvious effects, and improvement of photoelectric performance. Effect
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Embodiment 1
[0032] An embodiment of the present invention provides an LED epitaxial wafer, see figure 1 , the epitaxial wafer includes a substrate 1 , and a low-temperature buffer layer 2 , a high-temperature buffer layer 3 , an N-type layer 4 , an active layer 5 , an electron blocking layer 6 , and a P-type layer 7 sequentially stacked on the substrate 1 .
[0033] In this embodiment, the electron blocking layer 6 includes a GaN layer 61 ( figure 1 indicated by hatching), and at least two AlGaN layers 62 stacked on the GaN layer 61 in sequence. The Al composition content of the at least two AlGaN layers 62 increases or decreases layer by layer along the growth direction of the epitaxial wafer.
[0034] It should be noted that since the energy level height of the AlGaN layer energy band is related to the Al composition content, the Al composition content of at least two AlGaN layers 62 increases or decreases layer by layer along the growth direction of the epitaxial wafer, so at least tw...
Embodiment 2
[0061] An embodiment of the present invention provides a method for manufacturing an LED epitaxial wafer, which is used to manufacture the LED epitaxial wafer provided in Embodiment 1, see image 3 , the method includes:
[0062] Step 200: Perform pretreatment on the substrate.
[0063] In this embodiment, Veeco K465i type or C4 type MOCVD (Metal Organic Chemical Vapor Deposition, metal organic compound chemical vapor deposition) is used to realize the manufacturing method of the LED epitaxial wafer. Using high-purity H 2 (hydrogen) or high-purity N 2 (nitrogen) or high purity H 2 and high purity N 2 The mixed gas as the carrier gas, high-purity NH 3 As the N source, trimethylgallium (TMGa) and triethylgallium (TEGa) are used as the gallium source, trimethylindium (TMIn) is used as the indium source, silane (SiH4) is used as the N-type dopant, and trimethylaluminum ( TMAl) as an aluminum source, magnesium dicene (CP 2 Mg) as a P-type dopant.
[0064] Alternatively, the...
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