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Correcting method for spectral line interference in atomic emission spectrometric analysis of spark source

A technology of atomic emission spectroscopy and spectral line interference, which is applied in the fields of electrical excitation analysis, material excitation analysis, and material analysis through optical means, can solve problems such as spectral line interference and inaccurate quantitative analysis results, and achieve increased analysis costs and Timely, fast and accurate analysis of task performance

Active Publication Date: 2015-01-28
钢研纳克江苏检测技术研究院有限公司
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Problems solved by technology

[0005] The purpose of the present invention is to provide a method for correcting spectral line interference in spark source atomic emission spectroscopic analysis, which is used to solve the problem of inaccurate quantitative analysis results caused by mutual interference between different elements in the process of spectral analysis, and is suitable for spark or spark-like source atomic emission spectroscopy

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  • Correcting method for spectral line interference in atomic emission spectrometric analysis of spark source
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  • Correcting method for spectral line interference in atomic emission spectrometric analysis of spark source

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Embodiment 1

[0049] Embodiment 1 spectral analysis the content of cobalt in stainless steel

[0050] In stainless steel, cobalt has solid solution strengthening effect, endows steel with thermohardness, improves high temperature performance, oxidation resistance and corrosion resistance of steel, and is an important alloy of superhard high speed steel, hard alloy, magnetic steel or hard magnetic alloy, etc. element. The purpose of adding cobalt is not to improve corrosion resistance, but to increase hardness. Due to the high price of cobalt, due to cost considerations in industrial production, the detection accuracy is required to be high.

[0051] When using spark source atomic emission spectrometry to analyze stainless steel metal samples, in addition to cobalt atoms and ions, a considerable amount of chromium ions, nickel ions, iron ions, etc. are also produced. Therefore, the 258.0nm spectral line is commonly used as the analysis line of cobalt element in atomic emission spectrometry...

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Abstract

The invention belongs to the field of quantitative analysis of atomic emission spectrometry and particularly relates to a correcting method for spectral line interference in the atomic emission spectrometric analysis of a spark source. In the correcting method, a to-be-tested sample comprises a to-be-tested element X, and interference elements Ai and Mj. The influence of the interference elements is eliminated by the method through the study of the interference spectral lines and the interference rules of the interference elements Ai and Mj so as to automatically correct the analyzed spectral lines. The method is used for solving the problem that mutual interference among different elements in the spectrometric analysis process causes an inaccurate quantitative analysis result and is suitable for the atomic emission spectrometric analysis of the spark or spark-like source. No devices needs to be additionally arranged, and the analysis cost and the time are not increased. The correcting method is particularly suitable for rapid and accurate analysis tasks.

Description

technical field [0001] The invention belongs to the technical field of quantitative analysis of atomic emission spectroscopy, in particular to a method for correcting spectral line interference in spark source atomic emission spectroscopy, which is suitable for spark, electric arc or spark-like atomic emission spectroscopy. Background technique [0002] The principle of spark source atomic emission spectrometry is to transform the sample into gaseous atoms under the action of external energy, and to excite the outer electrons of the gaseous atoms to a high-energy state. When transitioning from a higher energy level to a lower energy level, the atom will release excess energy and emit characteristic spectral lines. After the generated radiation is dispersed and spectroscopically dispersed, the regular spectral lines presented are recorded in order of wavelength, which is the spectrogram. Then perform qualitative or quantitative analysis according to the obtained spectrum. I...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/67G01N21/01
Inventor 刘佳冯光袁良经贾云海
Owner 钢研纳克江苏检测技术研究院有限公司
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