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Welding method of tungsten target material component

A welding method and target technology, applied in welding equipment, welding/welding/cutting items, non-electric welding equipment, etc., can solve the problems of prone to cracks, prone to accidents, large differences in physical properties of tungsten and copper, etc. The effect of increasing welding strength, preventing oxidation, and being less prone to chipping

Active Publication Date: 2015-04-29
KONFOONG MATERIALS INTERNATIONAL CO LTD
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Problems solved by technology

[0008] In the existing diffusion welding process, the deformation of the tungsten target is relatively large. Because tungsten is brittle, the tungsten target is prone to cracks during the welding process. The occurrence of cracks will lead to accidents when the tungsten target component is used in the future. , and due to the large difference in physical properties between tungsten and copper, the welding strength of the tungsten target assembly obtained by the existing hot isostatic pressing welding method is low
[0009] In view of this, it is necessary to study a new welding method for tungsten target components to overcome the problem of low welding strength between tungsten target and copper back plate, and to overcome the problem that tungsten is prone to cracks during welding

Method used

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  • Welding method of tungsten target material component
  • Welding method of tungsten target material component
  • Welding method of tungsten target material component

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Embodiment Construction

[0042] Since the melting point of tungsten is 3407°C and the melting point of copper is 1084°C, the melting point of the two materials is quite different, and the diffusion between tungsten atoms and copper atoms often leads to the formation of brittle metal compounds, so the tungsten-copper target formed by copper backplane is used The welding strength of the material components is low.

[0043] To this end, the present invention provides a welding method for a tungsten target assembly, by turning the thread on the welding surface of the tungsten target, forming a groove in the copper back plate, and then installing the two together so that the tungsten target is located in the groove , and then carry out hot isostatic pressing welding, because the tungsten target is limited in the groove, and the hot isostatic pressing welding applies force uniformly in all directions, therefore, the deformation of the tungsten target is small during the welding process, and it is not easy to...

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Abstract

The invention discloses a welding method of a tungsten target material component. The welding method comprises the following steps: providing a tungsten target material and a copper back plate; turning threads in the welding surface of the tungsten target material; forming a groove in the copper back plate; mounting the tungsten target material in the groove; welding the tungsten target material and the copper back plate by a hot isostatic pressure method. Through the use of the welding method, the threads are turned in the welding surface of the tungsten target material, the groove is formed in the copper back plate, and the tungsten target material and the copper back plate are mounted together, so that the tungsten target material is positioned in the groove; then welding by the hot isostatic pressure method is performed, in the welding process, the deformation quantity of the tungsten target material is small, and a fragmentation phenomenon not easily occurs; in addition, because of the threads, the area of the welding surface of the tungsten target material is enlarged, and the welding strength of the tungsten target material component is improved; after welding, the threads are embedded in the copper back plate from the welding surface of the tungsten target material, so that the welding strength of the tungsten target material component is further improved.

Description

technical field [0001] The invention relates to the field of semiconductor manufacturing, in particular to a welding method for a tungsten target assembly. Background technique [0002] In the semiconductor industry, the target assembly is composed of a target that meets the sputtering performance and a back plate that can be combined with the target and has a certain strength. The back plate can play a supporting role when the target assembly is assembled to the sputtering base, and has the effect of conducting heat. For example, metal tungsten (Co) can be selected as the target material, and copper or copper alloy material with sufficient strength and high thermal and electrical conductivity can be selected as the back plate to form the target component. [0003] During the sputtering process, the working environment of the target assembly is relatively harsh. For example, the ambient temperature of the target assembly is relatively high, such as 300°C to 600°C; in addit...

Claims

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Application Information

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IPC IPC(8): B23K20/14B23K20/02B23K20/24B23K33/00
CPCB23K20/021B23K20/023B23K20/14B23K20/233B23K20/24B23K33/00B23K2101/40B23K2103/18
Inventor 姚力军相原俊夫大岩一彦潘杰王学泽李超
Owner KONFOONG MATERIALS INTERNATIONAL CO LTD
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