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Bi group solder alloy, method for bonding electronic part using same, and electronic part mounting substrate

A technology for electronic components and bonding methods, which is applied in the direction of assembling printed circuits, printed circuit components, and electrical components with electrical components, which can solve the problem that the solidus temperature is less than 265 ° C, the wetting ductility is reduced, and the wetting ductility is low. and other problems, to achieve the effect of no change in chip characteristics, improved mechanical strength, and high bonding reliability.

Inactive Publication Date: 2016-04-27
SUMITOMO METAL MINING CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The melting point of the Au-Sn solder is 280°C. Although there is no problem of remelting during installation, it is not practical because of its high price. Therefore, more Bi-Ag solders have been proposed.
[0010] Bi / 2.5% by mass Ag eutectic solder (melting point: 262°C) is a representative solder among Bi-Ag solders, but since its solidus temperature is lower than 265°C, there is a problem of remelting during mounting. Happening
[0018] However, if the solder alloy is coated on the lead frame island of the bare Cu frame, Cu will preferentially react with specific elements in the solder, such as Sn, and it is easy to wet because it has an oxide film on its surface. The reduction in wet ductility has the effect of
Moreover, since Cu is basically insoluble in Bi-based solder alloys and Pb-based solder alloys, there is a tendency for wet ductility to be lower than that of Ag plating.
That is, on a bare Cu frame, there is a problem that surface oxidation tends to progress, and solder wettability tends to deteriorate under the influence of surface roughness.

Method used

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  • Bi group solder alloy, method for bonding electronic part using same, and electronic part mounting substrate
  • Bi group solder alloy, method for bonding electronic part using same, and electronic part mounting substrate
  • Bi group solder alloy, method for bonding electronic part using same, and electronic part mounting substrate

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1-11

[0144] (1) Manufacture of solder alloys (solder preforms) for Ag-plated electronic components

[0145] First, Bi, Ag, Al, Te, Cu, Ni (purity of each element: 99.99% by weight or more) were prepared as raw materials. Spherical granular raw materials with a diameter of φ3mm or less are used as raw materials. When the raw materials are large flakes or lumps, the raw materials are cut while paying attention to making the molten alloy uniform without composition deviation due to the sampling location. Grinding, etc., to refine it to a size of 3mm or less. Next, a predetermined amount was weighed from these raw materials and put into a graphite crucible for a high-frequency melting furnace.

[0146] Next, the crucible containing the raw material was placed in a high-frequency melting furnace, and nitrogen gas was flowed at a flow rate of 0.7 L / min or more per 1 kg of raw material in order to suppress oxidation. In this state, the inside of the melting furnace was heated to 500° C....

Embodiment 12-24

[0168] (1) Manufacture of solder alloys (solder preforms) for bare Cu electronic components

[0169] A linear solder preform was produced in the same manner as in Examples 1-11 above, except that Bi, Ag, Al, P, Ge, Cu (purity of each element: 99.99% by weight or more) were used as raw materials. In all embodiments, it can be processed and wound into a wire shape.

[0170] (2) Physical properties and performance tests

[0171] Using the linear solder preform sample obtained by the above method, the measurement of the solidus temperature and the liquidus temperature, and the observation and measurement of the particle diameter containing the Ag-Al intermetallic compound were carried out. After that, the solder preform samples were chip-bonded to a lead frame made of Cu to evaluate the wettability, and after molding with epoxy resin, a temperature cycle test and a reflow test were performed to evaluate the bonding reliability. The results are shown in Table 2.

Embodiment 25-37

[0187] (1) Manufacture of solder alloys (solder preforms) for Ni-plated electronic components

[0188] A linear solder preform was produced in the same manner as in Examples 1-11 above, except that Bi, Ag, Al, Sn, Zn, P, Ge, Cu (purity of each element: 99.99% by weight or more) were used. as raw material. In all embodiments, it can be processed and wound into a wire form.

[0189] (2) Physical properties and performance tests

[0190] Using the linear solder preform sample obtained by the above method, the measurement of the solidus temperature and the liquidus temperature, and the observation and measurement of the diameter of the particles containing the AgAl intermetallic compound were carried out.

[0191] Furthermore, solder preform samples were die-bonded to a Ni-plated lead frame to evaluate wettability, and after molding with epoxy resin, a cycle test was performed to evaluate bonding reliability. The results are shown in Table 3.

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Abstract

Provided are a Bi group solder alloy containing a specific amount of Al in Bi-Ag, particles containing a metal compound of Ag and Al being dispersed within a solder alloy, a method for bonding an Ag-plated electronic part, a bare Cu frame electronic part, an Ni-plated electronic part, or the like using this Bi group solder alloy, and an electronic part mounting substrate. The Bi group solder alloy contains Ag and Al, does not contain a substantial amount of Pb, and has a Bi content of 80 mass% or greater, has a melting point solidus of 265 DEG C or greater, and a liquidus of 390 DEG C or less, wherein the Bi group solder alloy is characterized in that the Ag content is 0.6-18 mass%, the Al content is 0.1 to 3 mass%, Al constituting 1 / 20 to 1 / 2 of the Ag content, and particles containing an Ag / Al intermetallic compound are dispersed in the solder alloy.

Description

technical field [0001] The present invention relates to a Bi-based solder alloy, a method for joining electronic components using the same, and an electronic component mounting substrate. A Bi solder alloy with a line temperature of 390°C or less, excellent in machinability, mechanical strength, and bonding reliability, and an Ag-plated electronic component, a bare Cu frame electronic component, or a Ni-plated electronic component using the Bi solder alloy The bonding method of electronic components, etc., and the electronic component mounting substrate. Background technique [0002] When bonding electronic components, generally, electronic components such as semiconductor element chips are first bonded (die bonded) to a lead frame with solder, and then the solder is remelted (reflowed) to be mounted on a semiconductor package or the like. on the printed substrate. [0003] In the past, when mounting electronic components on substrates, Sn / 37% by mass Pb eutectic solder (m...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): B23K35/26C22C1/02C22C12/00H01L21/52H05K3/34
CPCB23K35/26C22C1/02C22C12/00H01L2224/32245H01L2224/48091H01L2224/48247H01L2224/73265H01L24/29H01L24/32H01L24/48H01L24/73H01L24/83H01L2224/83455H01L2224/83815H01L2924/00014H01L2924/15747H01L2224/29113H01L2924/351H01L2924/01322H01L2924/181C22C1/03B23K35/264H01L2224/45099H01L2924/01013H01L2924/01047H01L2924/01032H01L2924/01015H01L2924/0105H01L2924/0103H01L2924/01052H01L2924/01028H01L2924/01029H01L2924/013H01L2924/20107H01L2924/00012H01L2924/00H05K1/09H05K1/181H05K3/341H05K3/3457
Inventor 永田浩章
Owner SUMITOMO METAL MINING CO LTD