Low-temperature and low-pressure growth and Raman spectroscopy characterization of phosphorous-doped n-type germanium nanowires
A technology of germanium nanowires and Raman spectroscopy, applied in the field of low-temperature and low-pressure growth of N-type germanium nanowires and Raman spectroscopy characterization, can solve problems that need to be further explored
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Embodiment 1
[0026] Example 1, see Figure 1 to Figure 3 Shown:
[0027] The invention provides a method for low-temperature and low-pressure growth and Raman spectrum characterization of phosphorus-doped N-type germanium nanowires, which specifically includes the following steps:
[0028] (1) Clean the silicon substrate with deionized water, the parameters of the silicon substrate are: impedance 0.2Ω·cm -1 , no oxide layer, double-sided polishing, (111) crystal plane, N-type;
[0029] (2) Clean the silicon substrate with ethanol, and then use deionized water to clean the silicon substrate;
[0030] (3) Clean the silicon substrate with a mixture of sulfuric acid and hydrogen peroxide, and then use deionized water to clean the silicon substrate;
[0031] (4) Treating the silicon substrate with 5% to 10% hydrofluoric acid solution to obtain a hydrogenated surface;
[0032] (5) Place the cleaned silicon substrate in an electron beam evaporator for evaporation of gold catalyst, and evenly ...
Embodiment 2
[0039] The invention provides a method for low-temperature and low-pressure growth and Raman spectrum characterization of phosphorus-doped N-type germanium nanowires, which specifically includes the following steps:
[0040] (1) Clean the silicon substrate with deionized water, the parameters of the silicon substrate are: impedance 0.2Ω·cm -1 , no oxide layer, double-sided polishing, (111) crystal plane, N-type;
[0041] (2) Clean the silicon substrate with ethanol, and then use deionized water to clean the silicon substrate;
[0042] (3) Clean the silicon substrate with a mixture of sulfuric acid and hydrogen peroxide, and then use deionized water to clean the silicon substrate;
[0043](4) Place the cleaned silicon substrate in an electron beam evaporating device for evaporation of gold catalyst, and evenly plate gold nanoparticles on the silicon substrate to obtain a gold-plated silicon substrate. The evaporation current is 45mA. The plating rate is 0.1A / s, and the thickn...
Embodiment 3
[0047] The invention provides a method for low-temperature and low-pressure growth and Raman spectrum characterization of phosphorus-doped N-type germanium nanowires, which specifically includes the following steps:
[0048] (1) Clean the silicon substrate with deionized water, the parameters of the silicon substrate are: impedance 0.2Ω·cm -1 , no oxide layer, single-sided polishing, (100) crystal plane, P type;
[0049] (2) Clean the silicon substrate with ethanol, and then use deionized water to clean the silicon substrate;
[0050] (3) Clean the silicon substrate with a mixture of sulfuric acid and hydrogen peroxide, and then use deionized water to clean the silicon substrate;
[0051] (4) Treating the silicon substrate with 5% to 10% hydrofluoric acid solution to obtain a hydrogenated surface;
[0052] (5) Place the cleaned silicon substrate in an electron beam evaporator for evaporation of gold catalyst, and evenly plate gold nanoparticles on the silicon substrate to ob...
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Abstract
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