Novel calibration device and calibration method for total internal reflection fluorescence microscope penetration depth
A fluorescence microscope and total internal reflection technology, applied in the field of fluorescence microscope imaging, can solve the problems of inconvenient use and achieve the effects of simple operation, high calibration efficiency and simple device
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0054] The calibration device for the incident depth of the total internal reflection fluorescence microscope established above is placed in the scanning galvanometer system of Thornlabs, and then the laser is emitted from the laser produced by Melles Griot, and then imported into the collimating lens of Thornlabs through a single-mode fiber to complete the collimation ; The collimated light beam is incident into the scanning galvanometer system of Thornlabs Company for optical path deflection, and then incident into the scanning lens of Thornlabs Company for focusing. The light beam emitted by the scanning lens is expanded by the first field mirror, and then exits in parallel, and after being focused and reflected by the focusing lens and dichroic mirror of Thornlabs, the light beam is focused on the objective lens of the total internal reflection fluorescence microscope produced by OLYMPUS and projected on it. on the sample stage. The signal light emitted by the sample to be...
PUM
Property | Measurement | Unit |
---|---|---|
thickness | aaaaa | aaaaa |
size | aaaaa | aaaaa |
refractive index | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com