An Atomic Magnetic Microscopy Method Based on Cavity Resonance and Magnetic Concentration Structures

Abstract

The invention discloses an atom magnetic microscopy method based on cavity resonance and magnetic aggregation structure, a cavity resonance short pulse measurement method and an MEMS magnetic aggregation structure are utilized to respectively improve spatial resolution and magnetic field sensitivity of an atom magnetic micrioscopy magnetic field, the cavity resonance short pulse measurement method is to put an atomic gas chamber in a resonant cavity formed by pulse pumping light, the amplification of the pumping light is performed through the resonant cavity, and the polarization rate setting time of the pulse pumping light is shortened. In addition, in the method, non-linear amplification is performed on the space variation of the magnetic filed through magnetic filed variation-deturning- polarization rate reduction-deturning mechanism, so that the contrast ratio of the signal is greatly increased. MEMS magnetic aggregation structure is to utilize MEMS technology to prepare an atom side wall with a magnetic aggregation structure, and a required atomic gas chamber is prepared through a gas injection and bonding technology in an anaerobic box. The purpose of the invention is to guide a magnetic field generated by a to-be-detected sample on the surface of the atomic gas chamber in the gas chamber, and the amplification of the magnetic field can be realized through the magnetic aggregation structure.

Description

technical field [0001] The invention relates to an atomic magnetic microscopy technology based on cavity resonance and a magnetic aggregation structure, and belongs to the technical field of atomic magnetometers. Background technique [0002] Magnetic microscopy is the delicate measurement of magnetic field distributions. Through magnetic microscopic observation, the growth and development process of magnetic proteins can be characterized, and the weak magnetic distribution measurement of materials and non-destructive diagnosis of integrated circuits can also be carried out. [0003] In magnetic microscopic measurement, its main technical indicators are spatial resolution and magnetic field sensitivity. Common magnetic microscopy techniques include nitrogen vacancy color center (NV color center), Bose-Einstein condensate (BEC), superconducting quantum interference technique (SQUID) and atomic magnetometer technique (AM). The NV color center magnetic microscope has a high s...

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Problems solved by technology

However, in the follow-up work, it was found that there are two problems in short-pulse magnetic microscopy: 1. In short-pulse magnetic microscopy, the polarizability establishment time accounts for a large proportion of the pulse period; 2. Due to the There is a certain thickness of the wall, resulting in a certain distance between the sample to be tested and the sensitive atoms, which in turn attenuates the magnetic field of the sample and reduces the sensitivity of the magnetic field

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