Complementary metal oxide semiconductor (CMOS) compatible temperature detector and manufacturing method thereof
A technology of a temperature detector and a manufacturing method, which is applied to thermometers, thermometers and instruments using electrical/magnetic components directly sensitive to heat, etc., can solve the problems of increasing the thickness of the device, increasing the cost, increasing the steps of the process, and achieving The effect of reducing device thickness, reducing process steps, and reducing costs
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0044] The invention provides a CMOS-compatible temperature detector, the temperature detector is a bottom-up multi-layer structure with at least a substrate, a rear dielectric layer, and a top dielectric layer; the substrate is provided with a CMOS front For a device, the back-end dielectric layer is provided with a CMOS back-end metal interconnection layer, and the top dielectric layer is provided with a PAD. Wherein, the top dielectric layer or the subsequent dielectric layer is further provided with an electrode, and the surface of the electrode is covered with a thermistor, and the thermistor is exposed to the surface of the top dielectric layer through a thermal window.
[0045] In the present invention, the electrode is arranged in the top dielectric layer or the subsequent dielectric layer, and the independent electrode layer and thermistor layer on the CMOS subsequent circuit can be omitted, so that the thickness (volume) of the device can be reduced, and the manufactu...
PUM
Login to View More Abstract
Description
Claims
Application Information
Login to View More 


