Dielectric-metasurface-based compact optical measuring instrument
An optical measuring instrument and metasurface technology, applied in the field of optical devices, can solve the problems of limiting the integration of devices, increasing the reflectivity of incident light, increasing the complexity of the system, etc., to achieve the goal of increasing integration, reducing optical loss, and improving sensitivity Effect
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Embodiment 1
[0075] Figure 5 It is the top view of the basic module structure of the compact optical measuring instrument based on the medium metasurface provided in Example 1. For the detection of the polarization state, the FDTD algorithm is used for simulation, the wavelength of the incident light is set to 1000nm, and the polarization state is set to Horizontal linearly polarized light, vertical linearly polarized light, 45 degree linearly polarized light, -45 degree linearly polarized light, right-handed circularly polarized light and left-handed circularly polarized light, and is incident on the medium metasurface, and the detector array is located on the plane of the medium metasurface The common focal length of the lens.
[0076] For the detection of the wavefront, the FDTD algorithm is used for simulation, and the wavelength of the incident light is set to 1000nm, and its polarization state is 45 degrees linearly polarized light. The angle between the normal direction of the wavefron...
Embodiment 2
[0092] Figure 8 It is the top view of the basic module structure of the compact optical measuring instrument based on the medium metasurface provided in Example 2. For the detection of the polarization state, the FDTD algorithm is used for simulation, and the wavelength of the incident light is set to 1310nm, and the polarization state is set to Horizontal linearly polarized light, vertical linearly polarized light, 45 degree linearly polarized light, -45 degree linearly polarized light, right-handed circularly polarized light and left-handed circularly polarized light, and is incident on the medium metasurface, and the detector array is located on the plane of the medium metasurface The common focal length of the lens.
[0093] For the detection of the wavefront, the FDTD algorithm is used for simulation, and the wavelength of the incident light is set to 1310nm, and the polarization state of the linearly polarized light is 45 degrees. The angle between the normal direction of t...
Embodiment 3
[0110] Picture 11 It is the top view of the structure of the basic module of the compact optical measuring instrument based on the medium metasurface provided in Example 3. For the detection of the polarization state, the FDTD algorithm is used for simulation, and the wavelength of the incident light is set to 1550nm, and the polarization state is set to Horizontal linearly polarized light, vertical linearly polarized light, 45 degree linearly polarized light, -45 degree linearly polarized light, right-handed circularly polarized light and left-handed circularly polarized light, normal incident on the medium metasurface, the CCD detector array is in each plane of the medium metasurface The common focal length of the lens.
[0111] For the detection of the wavefront, the FDTD algorithm is used for simulation, and the wavelength of the incident light is set to 1550nm, and its polarization state is 45 degrees linearly polarized light. The angle between the normal direction of the wa...
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