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Dielectric-metasurface-based compact optical measuring instrument

An optical measuring instrument and metasurface technology, applied in the field of optical devices, can solve the problems of limiting the integration of devices, increasing the reflectivity of incident light, increasing the complexity of the system, etc., to achieve the goal of increasing integration, reducing optical loss, and improving sensitivity Effect

Active Publication Date: 2018-08-07
HUAZHONG UNIV OF SCI & TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

In 2015, Anders Pors et al. used a metasurface structure with birefringent interstitial surface plasmons to introduce phase gradient modulation of incident light with different polarization components, and successfully separated the polarization components of the incident light into different Outgoing direction, through the real-time detection of the intensity of diffracted light in each direction, the transient Stokes parameter is calculated, so as to uniquely determine the polarization state of the incident light, (Anders Pors et al. "Plasmonicmetagratings for simultaneous determination of Stokes parameters," Optica 2,716 -723(2015)); the device materials used are gold and silicon dioxide, which is to cover a layer of nanoscale thick silicon dioxide on a thicker gold layer, and then deposit a layer on it in space The structure formed by the array of nano-gold nuggets constantly changing in scale; since the nano-gold nugget array has a large loss of incident light when using transmitted light for detection, while retaining the ability of nano-metal nuggets to phase modulate the incident light , using a gap surface plasmon structure to increase the reflectivity of incident light, reduce the loss of incident light, and use reflected light for detection; however, due to the use of metal elements, there is inevitably a large optical loss ; In addition, because it is detected by reflected light, it is difficult to realize near-field detection. The system needs to use multiple optical lenses to focus the light diffracted in different directions to the surface of the detector, which increases the complexity of the system and limits the integration of devices. Spend
In addition, the system can only measure the polarization state of light and cannot detect the wavefront

Method used

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Examples

Experimental program
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Effect test

Embodiment 1

[0075] Figure 5 It is the top view of the basic module structure of the compact optical measuring instrument based on the medium metasurface provided in Example 1. For the detection of the polarization state, the FDTD algorithm is used for simulation, the wavelength of the incident light is set to 1000nm, and the polarization state is set to Horizontal linearly polarized light, vertical linearly polarized light, 45 degree linearly polarized light, -45 degree linearly polarized light, right-handed circularly polarized light and left-handed circularly polarized light, and is incident on the medium metasurface, and the detector array is located on the plane of the medium metasurface The common focal length of the lens.

[0076] For the detection of the wavefront, the FDTD algorithm is used for simulation, and the wavelength of the incident light is set to 1000nm, and its polarization state is 45 degrees linearly polarized light. The angle between the normal direction of the wavefron...

Embodiment 2

[0092] Figure 8 It is the top view of the basic module structure of the compact optical measuring instrument based on the medium metasurface provided in Example 2. For the detection of the polarization state, the FDTD algorithm is used for simulation, and the wavelength of the incident light is set to 1310nm, and the polarization state is set to Horizontal linearly polarized light, vertical linearly polarized light, 45 degree linearly polarized light, -45 degree linearly polarized light, right-handed circularly polarized light and left-handed circularly polarized light, and is incident on the medium metasurface, and the detector array is located on the plane of the medium metasurface The common focal length of the lens.

[0093] For the detection of the wavefront, the FDTD algorithm is used for simulation, and the wavelength of the incident light is set to 1310nm, and the polarization state of the linearly polarized light is 45 degrees. The angle between the normal direction of t...

Embodiment 3

[0110] Picture 11 It is the top view of the structure of the basic module of the compact optical measuring instrument based on the medium metasurface provided in Example 3. For the detection of the polarization state, the FDTD algorithm is used for simulation, and the wavelength of the incident light is set to 1550nm, and the polarization state is set to Horizontal linearly polarized light, vertical linearly polarized light, 45 degree linearly polarized light, -45 degree linearly polarized light, right-handed circularly polarized light and left-handed circularly polarized light, normal incident on the medium metasurface, the CCD detector array is in each plane of the medium metasurface The common focal length of the lens.

[0111] For the detection of the wavefront, the FDTD algorithm is used for simulation, and the wavelength of the incident light is set to 1550nm, and its polarization state is 45 degrees linearly polarized light. The angle between the normal direction of the wa...

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PUM

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Abstract

The invention discloses a dielectric-metasurface-based compact optical measuring instrument comprising a dielectric metasurface and a detector array. The detector array is arranged at a focal length of the dielectric metasurface. The dielectric metasurface consists of a plurality of basic modules, each two of adjacent which are in contact; and each basic module works interpedently to obtain a polarization state of to-be-measured light entering the surface of the basic module. Each basic module consists of a first planar focusing mirror, a second planar focusing mirror, a third planar focusingmirror, and a fourth planar focusing mirror, wherein the four planar focusing mirrors form a planar structure like a Chinese character ''tian'' from left to right and from top to bottom and the focallengths of the four planar focusing mirrors are consistent. The compact optical measuring instrument is able to detect the polarization state and the wavefront of the incident light; and a few of losses are caused in the visible light band and almost no losses are caused from the near infrared band to the infrared band. Therefore, the optical losses are reduced substantially and the sensitivity ofthe detection is improved.

Description

[0001] This application claims the priority of a Chinese patent application filed with the Patent Office of the State Intellectual Property Office of China, the application number is 201710187581.8, and the title of the invention is "a compact polarization state measuring instrument based on a medium supersurface" on March 27, 2017. The entire content is incorporated into this application by reference. Technical field [0002] The invention belongs to the technical field of optical devices, and more specifically, relates to a compact optical measuring instrument based on a medium supersurface. Background technique [0003] Optical polarization measuring instruments and optical wavefront measuring instruments have been used in the fields of optical communications, polarization imaging, adaptive optics, astronomy, biomedicine, and materials science. At present, in the field of optics, there are mainly two types of polarization measurement methods: one is to use the combination of qu...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J4/00
CPCG01J4/00G01J4/04
Inventor 杨振宇冯兴赵茗魏淑文
Owner HUAZHONG UNIV OF SCI & TECH