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An Efficient Defect Handling System for Graphene Chip Processing

A processing system, graphene technology, applied in metal processing equipment, control of workpiece feed movement, manufacturing tools, etc., can solve problems such as low accuracy judgment rate, low pass rate, low productivity, etc., to reduce comparison and analysis errors , improve the accuracy, improve the effect of the pass rate

Inactive Publication Date: 2020-10-16
中住信资产管理有限责任公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to solve the problems of low accurate judgment rate, low productivity and low pass rate in manual detection of graphene chips in the prior art, and propose a high-efficiency defect processing system for graphene chip processing

Method used

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  • An Efficient Defect Handling System for Graphene Chip Processing
  • An Efficient Defect Handling System for Graphene Chip Processing
  • An Efficient Defect Handling System for Graphene Chip Processing

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0023] refer to figure 1 , 2 , 3 and 5, a high-efficiency defect processing system for graphene chip processing, including a detection platform 1, a detection conveyor belt 2 is provided on the detection platform 1, and a defective product platform is vertically connected to the center of one side of the detection platform 1 3. The defective product conveyor belt 4 is installed on the defective product platform 3, and the side of the detection platform 1 away from the defective product platform 3 is welded with a support frame 17, and a processor 16 is installed on the support frame 17. modules, analysis modules and wireless modules, the analysis module is electrically connected to the comparison module, the analysis module is connected to the control center through the wireless module, and the side of the support frame 17 away from the detection platform 1 is vertically connected with the first suspension rod 5 and the second suspension rod. Rod 6, the first suspension rod 5...

Embodiment 2

[0026] refer to figure 1 , 2 And 3, both sides of the first suspension rod 5 and the second suspension rod 6 away from the end of the support frame 17 are connected with a photosensitive lighting lamp 18 by a diagonal rod, when the light is dim, the photosensitive lighting lamp 18 can be used to illuminate the graphene chip, which is convenient The clear images captured by the first detection head 7 and the second detection head 8 reduce the comparison and analysis errors of the processor and improve the accuracy of defect processing.

Embodiment 3

[0028] refer to Figure 4 , both central ends of the lifting plate 91 are provided with L-shaped pressure rods 93, and the tops of the two groups of pressure rods 93 pass through the lifting plate 91 to connect to the limiting block 94, and the limiting block 94 is connected to the lifting plate 91 through a spring. When the graphene chip is chamfered and polished, it is pressed by the pressure rod 93, which can avoid the movement of the graphene chip during grinding, thus ensuring the quality of grinding.

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Abstract

The invention discloses an efficient flaw treatment system for graphene chip processing. The system comprises a detection table, wherein the detection table is provided with a detection conveyor belt,the center of one side of the detection table is vertically connected with a defective product table, the defective product table is provided with a defective product conveyor belt, one side, away from the defective product table, of the detection table is welded with a supporting frame, one side, away from the detection table, of the supporting frame is vertically connected with a first suspension rod and a second suspension rod, the ends, away from the supporting frame, of the first suspension rod and second suspension rod are respectively connected with a first detection head and a seconddetection head, and a polishing device is arranged between the first detection head and the second detection head. The efficient flaw treatment system for the graphene chip processing has the advantages that image shooting is carried out twice on the graphene chip through the first detection head and the second detection head successively, a processor compares and analyzes shot images, so that itcan be accurately judged whether or not the chip has appearance defects and products are qualified after the defects are treated, the intelligent degree is high, thereby improving the efficiency of product inspection and appearance defect treatment judgment, effectively reducing the reject ratio of the products and improving the quality of the products.

Description

technical field [0001] The invention relates to the field of graphene chip processing equipment, in particular to an efficient defect processing system for graphene chip processing. Background technique [0002] Graphene is a carbon atom with sp 2 The hybrid orbitals form a hexagonal two-dimensional carbon nanomaterial with a honeycomb lattice. Graphene has excellent optical, electrical, and mechanical properties, and has important application prospects in materials science, micro-nano processing, energy, biomedicine, and drug delivery, and is considered to be a revolutionary material in the future. [0003] In the molding and pressing stage of graphene chips, even if the process corners are designed, there will still inevitably be sharp chamfers and flaws in the appearance. It is necessary to chamfer the corners of graphene chips, mainly artificial chamfering , while artificial chamfering mainly uses a knife or blade to rotate and wipe the corners of the chip, which not o...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): B24B19/22B24B41/00B24B47/20B24B49/12B24B51/00
CPCB24B19/22B24B41/005B24B47/20B24B49/12B24B51/00
Inventor 金祺青
Owner 中住信资产管理有限责任公司
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