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Manufacturing method of epitaxial wafer of light emitting diode

A technology for light-emitting diodes and a manufacturing method, which is applied to electrical components, circuits, semiconductor devices, etc., can solve the problems of surface morphology change of the 3D nucleation layer, poor crystal quality of the 3D nucleation layer, affecting the luminous efficiency of LEDs, etc. The effect of antistatic ability, improving crystal quality and improving luminous efficiency

Inactive Publication Date: 2019-02-12
HC SEMITEK ZHEJIANG CO LTD
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Problems solved by technology

[0005] The surface of the 3D nucleation layer grown by the above method will have an excessive amount of unreacted Ga source remaining, and the residual Ga source will react with some areas (where the surface adsorption energy is large), resulting in a change in the surface morphology of the 3D nucleation layer, thereby The crystal quality of the grown 3D nucleation layer is poor, which affects the luminous efficiency of the LED

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  • Manufacturing method of epitaxial wafer of light emitting diode

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Embodiment Construction

[0028] In order to make the object, technical solution and advantages of the present invention clearer, the implementation manner of the present invention will be further described in detail below in conjunction with the accompanying drawings.

[0029] An embodiment of the present invention provides a method for manufacturing a light emitting diode epitaxial wafer, figure 1 It is a method flowchart of a method for manufacturing a light-emitting diode epitaxial wafer provided by an embodiment of the present invention, as shown in figure 1 As shown, the manufacturing method includes:

[0030] Step 101, providing a substrate.

[0031] In this embodiment, the substrate is sapphire.

[0032] Step 101 also includes:

[0033] The temperature of the reaction chamber is controlled at 1050° C., the pressure is 200-500 Torr, the sapphire substrate is annealed in a pure hydrogen atmosphere for 5-6 minutes, and then the sapphire substrate is nitrided.

[0034] In this embodiment, Veeco...

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Abstract

The invention discloses a manufacturing method of an epitaxial wafer of a light emitting diode, and belongs to the technical field of semiconductors. The manufacturing method comprises the following steps: providing a substrate; growing a buffer layer on the substrate; growing a 3D nucleation layer on the buffer layer; during the growth of the 3D nucleation layer, continuously feeding ammonia intoa reaction chamber, and intermittently feeding trimethylgallium; and growing an undoped GaN layer, an N-type layer, a multi-quantum well layer and a P-type layer sequentially on the 3D nucleation layer. The 3D nucleation layer adopts a segmented growth mode, that is, after the 3D nucleation layer grows for a period of time, the surface of the grown 3D nucleation layer is treated by the ammonia, which can reduce the existence of elemental Ga on the surface of the 3D nucleation layer, so that the wafer quality of the 3D nucleation layer is improved, the antistatic capacity of an LED (Light Emitting Diode) under a large current density is increased, and the light emitting efficiency of the LED is finally improved.

Description

technical field [0001] The invention relates to the technical field of semiconductors, in particular to a method for manufacturing a light-emitting diode epitaxial wafer. Background technique [0002] LED (Light Emitting Diode, Light Emitting Diode) is a semiconductor electronic component that can emit light. As an efficient, environmentally friendly and green new solid-state lighting source, it is being rapidly and widely used, such as traffic lights, car interior and exterior lights, urban landscape lighting, mobile phone backlights, etc. [0003] The epitaxial wafer is the main component of the LED. The existing GaN-based LED epitaxial wafer includes a substrate, a buffer layer stacked on the substrate, a 3D (three-dimensional, three-dimensional) nucleation layer, and an undoped GaN layer. , N-type layer, multiple quantum well layer and P-type layer. The 3D nucleation layer is a GaN layer. When growing the 3D nucleation layer, ammonia gas is usually used as the N source...

Claims

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Application Information

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IPC IPC(8): H01L33/32H01L33/12H01L33/06H01L33/00
CPCH01L33/0075H01L33/06H01L33/12H01L33/32
Inventor 舒辉郭炳磊肖云飞胡加辉李鹏
Owner HC SEMITEK ZHEJIANG CO LTD
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