A Judgment Method of Low Dose Rate Radiation Damage Enhancement Effect

A technology with low dose rate and enhanced effect, applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., to achieve the effect of reducing radiation risk and high reliability

Active Publication Date: 2021-04-13
CHINA ACADEMY OF SPACE TECHNOLOGY
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  • Application Information

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Problems solved by technology

[0005] The technical problem of the present invention is: to overcome the deficiencies of the prior art, a method for judging the enhancement effect of low dose rate radiation damage is proposed, which solves the problem of determining the dose rate of ionizing radiation when evaluating the total radiation resistance of components. The problem

Method used

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  • A Judgment Method of Low Dose Rate Radiation Damage Enhancement Effect
  • A Judgment Method of Low Dose Rate Radiation Damage Enhancement Effect
  • A Judgment Method of Low Dose Rate Radiation Damage Enhancement Effect

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Experimental program
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Effect test

Embodiment

[0048] Test device selection

[0049] The G7J139MJ type low power consumption, low offset four-voltage comparator produced by Jinzhou 777 Factory was selected as the tested device.

[0050] The radiation source is a cobalt 60 gamma ray source, and the inhomogeneity of the radiation field within the irradiated area of ​​the test sample is less than 10%. The uncertainty of radiation dose rate is less than 5%. Radiation ambient temperature requirements: 15°C to 30°C. Two dose rates of 0.005rad(Si) / s and 50rad(Si) / s were used to irradiate 7J139 devices, and parameters such as input offset voltage, power supply current, input bias current, input offset current, and open-loop voltage gain were mainly tested. .

[0051] The test circuit board requirements are as follows:

[0052] a) Device sockets that are not sensitive to radiation should be selected to make test circuit boards, and the device sockets should not affect the uniformity of the radiation field. Other components on ...

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Abstract

A method for judging the enhancement effect of low-dose-rate radiation damage, comprising the steps of: 1) obtaining the test results of electrical parameters of the object to be tested before irradiation; 1. Ionizing radiation tests with different biases to obtain electrical parameter test results at multiple irradiation dose points; 3) determining the ratio of the electrical parameter degradation of the object to be tested and the reliability influencing factor of the electrical parameter degradation of the object to be tested ; 4) According to the ratio of the electrical parameter degradation amount and the electrical parameter degradation reliability impact factor, it is determined whether the object to be tested has a low dose rate radiation damage enhancement effect. The present invention obtains comparative data of high and low dose rates by carrying out high and low dose rate irradiation tests respectively, and obtains whether aerospace components have low dose rate radiation damage by considering the component parameter degradation factor and the size of low dose rate radiation damage enhancement factor Judgment results of reinforcement effects.

Description

technical field [0001] The invention relates to a method for judging the enhancement effect of low dose rate radiation damage, belonging to the technical field of anti-radiation components. Background technique [0002] Spacecraft operating in a space radiation environment will be affected by space radiation. The total dose radiation effect in space needs to be considered, and the components in the spacecraft need to be evaluated for total dose resistance. However, satellites have been in orbit for at least a few years or more than ten years, and the space radiation dose rate is usually below 0.01rad(Si) / s. The irradiation period is long, usually calculated in years, and the ground simulation evaluation test cannot be carried out at the same dose rate as the space on-orbit. Usually, the high-dose-rate environment is used to evaluate the ability of the device to withstand low-dose-rate radiation in orbit. Due to the low dose rate radiation damage enhancement effect of bipola...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00G01N1/44
CPCG01N1/44G01R31/003
Inventor 吕贺李鹏伟孙明张洪伟梅博于庆奎李兴冀杨剑群
Owner CHINA ACADEMY OF SPACE TECHNOLOGY
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