A Curved Spectral Line Correction Method Based on Digital Micromirror
A technology of digital micromirror and correction method, which is applied in the field of spectral analysis, can solve the problems of spectral signal-to-noise ratio decline, inconvenient actual measurement, practical application constraints, etc., and achieve the effect of improving signal-to-noise ratio
Active Publication Date: 2021-03-12
JILIN UNIV
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[0008] The above disadvantages of the prior art: 1, the calculation formula deduced by the theoretical formula of the optical system cannot directly use the formula to calculate the final result due to inevitable adjustment errors, etc.; 2, the optical formula involves many parameters such as angles, which is inconvenient Actual measurement leads to the restriction of practical application, so the verification method of existing results is simulation verification
3. According to the array (full column) flip control mode, what is detected is local spectral information, resulting in a decrease in the spectral signal-to-noise ratio
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[0026] Such as Figure 6 As shown, the correction method of the curved spectral line based on the digital micromirror of the present invention is specifically as follows:
[0027] Step 1. Obtain three-dimensional full-spectrum data: such as figure 1 As shown, taking a digital micromirror with a specification of 1024*768 as an example, the digital micromirror array is controlled to scan the full spectrum of the excitation light source of a known element in a point-by-point or block-by-block scanning manner to obtain full-spectrum data; The spectral data includes the signal intensity corresponding to each pixel (one or more digital micromirrors can be included in a pixel); the spectral line wavelength λ corresponding to this element 1 ,λ 2 ,···λ n ···,λ N ;In the figure, the color depth is used to indicate the signal strength, and the darker the color, the greater the signal strength;
[0028] Step 2, determine the range of each curved spectral line in the three-dimensional...
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The invention relates to a method for correcting curved spectral lines based on a digital micromirror. The method is as follows: obtaining three-dimensional full-spectrum data; determining the range of each curved spectral line in the spectrogram; The spectral center position and the corresponding signal intensity of a row; determine the fitting range; Step 5, fit the relationship between the pixel position and the wavelength of each row within the fitting range, and obtain the wavelength values corresponding to all pixels; the calculation cannot be fitted Combine the wavelength values corresponding to some pixels; realize the bending and flipping detection of the digital micromirror. The invention does not need to consider error items caused by installation and adjustment errors and environmental errors, and can improve the signal-to-noise ratio of the measured spectral lines.
Description
technical field [0001] The invention belongs to the technical field of spectral analysis, and in particular relates to a method for correcting curved spectral lines based on a digital micromirror. Background technique [0002] In spectroscopic analysis instruments, it is a very common method to realize spatial separation of polychromatic light by using a diffraction grating. The incident slit of the spectrometer is perpendicular to the main section of the grating, the chief ray at the center of the slit coincides with the main section of the grating, and the chief ray at other points of the slit It forms an angle with the main section of the grating, which causes the spectral line to bend. Due to the existence of spectral line bending, spectral resolution, luminous flux and signal-to-noise ratio will be affected. Most of the existing methods for correcting spectral line bending start from the aspect of optical design. The curved spectral line correction methods based on dat...
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IPC IPC(8): G01J3/28G01J3/02
Inventor 田地王宏霞李春生
Owner JILIN UNIV