Silicon wafer etching method, method for preparing antireflective texture surface on silicon wafer surface and method for etching specific patterns on silicon wafer surface
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- INST OF ELECTRICAL ENG CHINESE ACAD OF SCI
- Publication Date
- 2019-09-20
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Abstract
Description
technical field
[0001] The invention relates to the technical field of semiconductor etching, in particular to a method for etching a silicon chip, a method for preparing an anti-reflection texture on the surface of a silicon chip and a method for etching a specific pattern on the surface of a silicon chip. Background technique
[0002] Etching silicon wafers to form patterned or randomly distributed micro-nano structures is a necessary step in the manufacture of many semiconductor devices. The techniques for etching silicon wafers are mainly divided into dry etching and wet etching.
[0003] Dry etching mainly utilizes reactive gas or / and plasma to etch through chemical or / and physical action. A representative method for dry etching of silicon wafers is reactive ion etching (RIE: Reactive Ion Etching), which is usually a combination of reactive gases containing halogen atoms (such as CF 4 / O 2 , SF 6 / O 2 etc.) into the plasma electric field, combined with the chemical...