Automatic aging test system for constant-temperature crystal oscillator

Abstract

The invention discloses an automatic aging test system for a constant-temperature crystal oscillator. The automatic aging test system comprises an aging test box, a control computer, a frequency counter and a rubidium atomic clock, the aging test box body is internally provided with a thermal insulation layer, the working environment temperature of test equipment can be reduced, the service life of the test equipment is prolonged, the working environment temperature of the constant-temperature crystal oscillator can be increased, the working current is reduced, and the test cost is saved; andthe aging test box is internally provided with a plurality of main test circuit boards and a plurality of auxiliary test circuit boards. Each main test circuit board comprises a constant temperature crystal oscillator and a frequency transmission circuit. Each auxiliary test circuit board comprises a frequency transmission circuit, a voltage protection circuit, a switching power supply voltage regulation circuit, a voltage-controlled voltage circuit and a communication level conversion circuit. The testing system disclosed by the invention can automatically acquire frequency data of the large-scale constant-temperature crystal oscillator, automatically adjust and test power supply voltage, realize overvoltage protection of the power supply voltage, automatically adjust the voltage-controlled voltage, and realize automatic timing startup and shutdown of the constant-temperature crystal oscillator and the like.

Description

technical field [0001] The invention relates to the field of frequency testing of crystal oscillators, in particular to a large-scale constant temperature crystal oscillator aging automatic testing system. Background technique [0002] At present, the constant temperature crystal oscillator aging automatic test system is a test frame structure, which mainly uses the radio frequency program-controlled switch to conduct the frequency signal, and the fixed voltage switching power supply supplies power for the constant temperature crystal oscillator. The constant temperature crystal oscillator is inserted on the power-on board, and the output signal is connected to the RF program-controlled switch through the coaxial cable. The RF program-controlled switch is a program-controlled device that can switch many-to-one channels through physical relays. Connect to frequency counter. The entire test system uses a large number of coaxial cables, radio frequency program-controlled switc...

AI Technical Summary

Problems solved by technology

The entire test system uses a large number of coaxial cables, radio frequency program-controlled switches, bloated structure and low space utilization

At the beginning of the design of the test system, the problem of system compatibility was not considered. When the production capacity of the constant temperature crystal oscillator changes, it is necessary to change the test board with different packages and voltages. It is very difficult to modify the test system.

At present, the test system is an open structure. After a large number of constant temperature crystal oscillators are powered on, their own current consumption is high, the test power consumption is large, the cost is high, and the temperature of

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