Contact plug, semiconductor device and method of manufacturing the same
A contact plug and manufacturing method technology, which is applied in the fields of semiconductor/solid-state device manufacturing, semiconductor devices, semiconductor/solid-state device parts, etc. The effect of reducing contact resistance
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[0045] A method of manufacturing a contact plug, comprising the steps of:
[0046] First, please refer to Figure 1A , 1B and Figure 2A , provide a semiconductor substrate 100, a gate structure 101 (which may be a polysilicon gate structure or a high-K metal gate structure) is formed on the semiconductor substrate 100, and the top of the gate structure 101 is covered with A silicon nitride mask layer 102, sidewalls 103 are formed on the sidewalls of the gate structure 102 and the silicon nitride mask layer 102, and fins 100a are formed in the semiconductor substrate 100 (which may be formed by embedded source-drain epitaxy source or drain region formed by the process);
[0047] Then, please continue to refer to Figure 1A , 1B and Figure 2A , depositing a sufficiently thick interlayer dielectric layer 104 on the surfaces of the semiconductor substrate 100, sidewalls 103, and silicon nitride mask layer 102, and planarizing the top of the interlayer dielectric layer 104;...
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