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Structure and method for achieving polarization interference based on metasurface and application of structure for achieving polarization interference based on metasurface

A metasurface, polarization direction technology, applied in the field of micro-nano optics, can solve problems such as system simplification, and achieve the effects of sensitivity and responsivity, light weight and simple structure

Active Publication Date: 2020-01-31
WUHAN UNIV
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Problems solved by technology

However, the traditional polarization interferometer needs to design and build a huge and complex optical path system in order to obtain two beams of polarized light with a large phase difference and exiting in the same direction, and it is difficult to simplify the system in order to achieve high sensitivity

Method used

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  • Structure and method for achieving polarization interference based on metasurface and application of structure for achieving polarization interference based on metasurface
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  • Structure and method for achieving polarization interference based on metasurface and application of structure for achieving polarization interference based on metasurface

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Embodiment Construction

[0027] The principle design and technical effects of the present invention will be further elaborated below in conjunction with the accompanying drawings and specific embodiments.

[0028] As shown in the figure, in this embodiment, the working wavelength of the incident light is λ=633nm, and the electromagnetic simulation software CST is used for modeling and simulation, such as figure 1 As shown, the nano-brick unit structure is composed of 1-silver nano-bricks, 2-silica substrate, and 3-silver reflective layer. The parameters of the nano-brick structure, namely the long axis size, short axis size, height and unit size, are optimized to obtain Optimum structural parameters, the x-line polarized light along the long axis of the nanobrick and the y-line polarized light along the short axis are respectively incident, and the x-line polarized light reflectance is the highest and the transmittance is the lowest, and the y-line polarized light transmittance is the highest and the r...

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Abstract

The invention discloses a structure and a method for achieving polarization interference based on a metasurface and application of a structure for achieving polarization interference based on a metasurface, and relates to the technical field of micro-nano optics. The structure is composed of a top layer-silver nano brick array, a middle layer-silicon dioxide transparent substrate and a bottom layer-silver reflecting layer. Because of the fact that the silicon dioxide transparent substrate is extremely thick, the structure can enable two polarized lights with orthogonal polarization directionsto generate great phase difference, and therefore, response very sensitive to the working wavelength and the incident light angle is obtained. The structure and the method can be applied to wavelengthselection and light beam collimation, can sensitively detect small changes of wavelength and incident light angle due to extremely high sensitivity, can be applied to incident light collimation, wavelength selection and the like, and has extremely high sensitivity and precision.

Description

technical field [0001] The invention relates to the field of micro-nano optics technology, in particular to a structure, method and application for realizing polarization interference based on a metasurface. Background technique [0002] Generally speaking, two light waves whose vibration directions are perpendicular to each other cannot produce interference phenomenon, but when an analyzer is added, the two components projected on the transmission axis of the analyzer have the same vibration direction, so the conditions for light wave interference are satisfied . Polarization interference refers to the interference of two polarized lights that have the same frequency and fixed phase difference and vibrate on the same plane. The application of polarized light interference is very wide, and it has been applied in the measurement of the stress of the material structure, the study of the microstructure of the material, the analysis of the physical properties of the material an...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G02B1/00G02B27/28
CPCG02B1/002G02B27/28
Inventor 郑国兴崔圆李子乐单欣李仲阳
Owner WUHAN UNIV
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