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Detection substrate, manufacturing method thereof and flat panel detector

A technology for detecting substrates and manufacturing methods, which is applied to semiconductor devices, electric solid-state devices, radiation control devices, etc., and can solve problems such as poor stability and affecting the performance of flat-panel detectors

Pending Publication Date: 2020-06-05
BOE TECH GRP CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, during the deposition process of the PIN film, hydrogen atoms (H plasma) diffuse to the channel region of a-IGZO TFT, resulting in poor stability of a-IGZO TFT, which in turn affects the performance of the flat panel detector.

Method used

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  • Detection substrate, manufacturing method thereof and flat panel detector
  • Detection substrate, manufacturing method thereof and flat panel detector
  • Detection substrate, manufacturing method thereof and flat panel detector

Examples

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Embodiment Construction

[0054] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention more clear, the following will clearly and completely describe the technical solutions of the embodiments of the present invention in conjunction with the drawings of the embodiments of the present invention. The thickness and shape of each film layer in the drawings do not reflect the real scale, and the purpose is only to illustrate the content of the present invention. Apparently, the described embodiments are some, not all, embodiments of the present invention. Based on the described embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0055] Unless otherwise defined, the technical terms or scientific terms used herein shall have the usual meanings understood by those skilled in the art to which the present invent...

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PUM

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Abstract

The invention discloses a detection substrate, a manufacturing method thereof and a flat panel detector. The detection substrate comprises a substrate body, a plurality of transistors, an oxide layer,a plurality of reading electrodes and a plurality of photoelectric conversion structures, wherein the transistors, the oxide layer, the reading electrodes and the photoelectric conversion structuresare sequentially located on the substrate body; the first electrodes of the transistors are electrically connected with the photoelectric conversion structures in a one-to-one correspondence manner through the reading electrodes, and the material of an active layer comprises an oxide; and each photoelectric conversion structure comprises an N-type semiconductor layer, an intrinsic semiconductor layer and a P-type semiconductor layer. The oxide layer at least covers the channel regions of the transistors and is insulated from the reading electrodes. The oxide layer covering the channel regionsof the transistors is arranged between the layer where each transistor is located and the layer where each reading electrode is located, so hydrogen atoms generated in the subsequent process of depositing the photoelectric conversion structure react with the oxide layer, the hydrogen atoms are prevented from reaching the channel region, the stability of the transistor is effectively improved, andthe performance of the flat panel detector is improved.

Description

technical field [0001] The invention relates to the technical field of photoelectric detection, in particular to a detection substrate, a manufacturing method thereof and a flat panel detector. Background technique [0002] X-ray inspection technology is widely used in industrial non-destructive testing, container scanning, circuit board inspection, medical treatment, security, industry and other fields, and has broad application prospects. Traditional X-Ray imaging technology belongs to analog signal imaging, which has low resolution and poor image quality. The X-ray digital imaging technology (Digital Radio Graphy, DR) that appeared in the late 1990s uses X-ray flat panel detectors to directly convert X-ray images into digital images, because the converted digital images are clear, high-resolution, and easy to save and store. Transmission has become a hot research topic at present. According to different structures, X-ray flat panel detectors are divided into direct conv...

Claims

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Application Information

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IPC IPC(8): H01L27/146H01L29/786H01L21/34
CPCH01L27/14658H01L27/14616H01L27/14689H01L29/78606H01L29/7869H01L27/14605H01L29/66969
Inventor 侯学成尚建兴商晓彬
Owner BOE TECH GRP CO LTD
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