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Method, System and Medium for Optimally Blocking Impurity Band Detector Noise

A technology for detector noise and blocking impurities, which is applied in the field of semiconductor photodetectors and can solve the problems of high time and economic costs

Active Publication Date: 2022-04-01
上海微波技术研究所(中国电子科技集团公司第五十研究所)
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Problems solved by technology

For the noise design of BIB detectors, the existing method is to design a series of BIB detectors with different thicknesses of the barrier layer for test strips, and then select the best ones according to the test strip results, and the time and economic costs are high.

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Embodiment Construction

[0051] The present invention will be described in detail below in conjunction with specific embodiments. The following examples will help those skilled in the art to further understand the present invention, but do not limit the present invention in any form. It should be noted that those skilled in the art can make several changes and improvements without departing from the concept of the present invention. These all belong to the protection scope of the present invention.

[0052] According to a kind of method of optimizing BIB detector noise design provided by the present invention, comprise the steps:

[0053] Step 1: Construct the structural model of the barrier impurity band (BIB) detector;

[0054] Step 1.1: sequentially forming an absorption layer, a barrier layer, an electrode layer and a passivation layer on a high-conductivity substrate;

[0055] Step 1.2: forming a positive electrode on the electrode layer, and forming a negative electrode on the high-conductivi...

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Abstract

The present invention provides a method, system and medium for optimizing the blocking of impurity band detector noise. Firstly, through numerical simulation and data fitting, the spectral density of the detector noise is related to different thicknesses of the barrier layer under a specific working bias voltage and a specific working temperature. According to the functional formula and the designed noise spectral density, the corresponding customized barrier layer thickness is extracted, and the detector manufactured according to the barrier layer thickness can make the noise spectral density meet the design requirements. The advantage of this method is that the relationship between the noise spectral density and the thickness of the barrier layer can be extracted from the barrier impurity band detectors obtained by different material systems and different process conditions, and the customized barrier layer thickness under specific working bias voltage and specific working temperature can be obtained. , the noise spectral density of the detector thus designed and produced will meet the design requirements, avoiding repeated test strips in order to optimize the design of the detector noise, greatly shortening the detector development cycle and reducing the development cost.

Description

technical field [0001] The present invention relates to the technical field of semiconductor photodetectors, in particular to a method, system and medium for optimally blocking impurity band detector noise. Background technique [0002] Terahertz waves usually refer to electromagnetic waves with wavelengths between 30 and 3000 μm (frequency between 0.1 and 10 THz), which have high reflectivity to metals and high transparency to most dielectric materials and non-polar materials. Using this characteristic, a terahertz human body security detector can be made for the detection and identification of hidden objects in the human body, and a terahertz nondestructive flaw detector can also be made for the internal defect detection of aerospace materials. In addition, terahertz waves also have fingerprint characteristics, thermal effects, and cloud penetration capabilities. Therefore, terahertz technology has broad application prospects in the fields of biomedicine, atmospheric monit...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F30/20G06F111/10G06F119/10
Inventor 王晓东陈雨璐王兵兵张传胜童武林胡永山于春蕾张皓星刘文辉
Owner 上海微波技术研究所(中国电子科技集团公司第五十研究所)
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