Unlock instant, AI-driven research and patent intelligence for your innovation.

Semiconductor device and preparation method thereof

A semiconductor and device technology, applied in the field of semiconductor devices and their preparation, can solve the problems of large channel spacing, increased energy costs, increased energy loss of optical modules, etc.

Active Publication Date: 2021-01-15
SHANXI YUANJIE SEMICONDUCTOR TECH CO LTD
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The 5G communication system focuses on the improvement of communication quality and the effective control of costs. However, since the cooling device is introduced into the 25Gbps semiconductor device, it will inevitably increase the energy consumption of the entire optical module. If you want to control the temperature of the cooling device at room temperature or even lower , although it can guarantee the excellent performance of the chip, it also wastes more power consumption on the cooling device, which makes the MWDM and LWDM schemes with high equipment cost and increase the energy cost at the same time, in order to improve this problem , the temperature control of the cooling device will be set at around 50°C, which is evaluated as the temperature at which the power consumption of the cooling device can be effectively reduced and the performance of the semiconductor device can still operate normally
[0005] General 25Gbps semiconductor devices are sensitive to temperature changes, especially bandwidth (Bandwidth) deteriorates significantly with temperature. If you want to realize 25Gbps semiconductor devices at 50°C from the perspective of commercialization, the problem to be overcome lies in the quality of the wafer. After all, under the temperature control of the external environment of 50°C, the junction temperature (Junction Temperature) of the active layer inside the semiconductor device is at least above 60°C~70°C. The commercial yield rate also has a great impact. The commercial yield rate is also related to the manufacturing cost of the chip. It can overcome the yield fluctuation caused by the process from the design to achieve a high commercial yield rate. This is for the cooling type 25Gbps semiconductor device is very important
[0006] For 12-wave MWDM, the channel spacing is larger than that of LWDM. Generally, in order to ensure the wafer yield, one channel must be designed to match the epitaxial structure of a wafer. 12 channels means that there must be 12 types of wafer epitaxial structure design. The production capacity and time control of equipment is very unfavorable, and although the LWDM channel spacing is small, the completion of 12-channel LWDM chips must also correspond to at least 5 types of wafer epitaxial structure design, which has an impact on production efficiency and cost

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Semiconductor device and preparation method thereof
  • Semiconductor device and preparation method thereof
  • Semiconductor device and preparation method thereof

Examples

Experimental program
Comparison scheme
Effect test

preparation example Construction

[0099] Based on the same inventive concept, the present application provides a semiconductor device preparation method, comprising the following steps:

[0100] S10, providing a substrate 10, and growing a buffer layer 11 and a first confinement layer 12 on the surface of the substrate 10;

[0101] S20, on the surface of the first confinement layer 12 away from the substrate 10, the first quantum well layer 131 and the barrier layer 132 are stacked and grown sequentially, and the second quantum well layer 133 and the barrier layer 132 are stacked alternately, to generate the active layer 13;

[0102] S30, growing a second confinement layer 14 on the surface of the active layer 13 away from the first confinement layer 12;

[0103] Wherein, the wavelength difference between the first quantum well layer 131 and the second quantum well layer 133 is 10 nm to 20 nm.

[0104] In this embodiment, the semiconductor epitaxial structure preparation method adopts MOCVD to grow the buffe...

Embodiment 1

[0113] In this embodiment, the purpose of improving the 50°C bandwidth of the LWDM channel 4 is achieved by optimizing the number of the first quantum well layer 131 in the active region, and there are four other parameters that need to be optimized, namely, the number of the second quantum well layer 133, the number of the second quantum well layer 133, The thickness of the quantum well, the stress of the quantum well and the potential barrier, and the wavelength difference between the first quantum well layer 131 and the second quantum well layer 133 , these four parameters will be optimized and designed one by one in the embodiments 2 to 5 respectively. In Example 1, the thickness of the quantum well will first take near the middle value of the value range (that is, the thickness is 60 Å), and the stress of the quantum well and the potential barrier will first take the middle value near the larger value range (that is, the quantum well compressive stress +1.0% and barrier te...

Embodiment 2

[0115] In this embodiment, the number of the second quantum well layer 133 in the active region is optimized to ensure that the 50°C bandwidth of the LWDM channel 1 is greater than 19 GHz, such as Figure 11 As shown, the number of the first quantum well layer 131 in Example 1 is within the range of 5 to 7, and when the number of the second quantum well layer 133 is within the range of 4 to 5, all of them can meet the 50°C temperature of the LWDM channel 1. The bandwidth requirement is 19GHz, wherein, when the number of the first quantum well layer 131 is 6 and the number of the second quantum well layer 133 is 5, the bandwidth value is 19.7GHz, so the number of the second quantum well layer 133 is 5. The best value of the example. .

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a semiconductor device and a preparation method thereof. An active layer in the semiconductor device comprises a first quantum well layer and a second quantum well layer whichare arranged in the stacking direction, the wavelength difference between the first quantum well layer and the second quantum well layer ranges from 10 nm to 20 nm, and by setting the wavelength difference between the first quantum well layer and the second quantum well layer, the active layer is enabled to have two types of quantum wells at the same time, and the formed overall material gain isformed by superposing two groups of material gains at different wavelength positions, thereby achieving the simultaneous manufacturing of two MWDM-standard channel semiconductor devices or four LWDM-standard channel semiconductor devices through a single semiconductor device. Different from the technology that only one channel semiconductor device is manufactured on a common semiconductor device,the semiconductor device is beneficial to improving the production efficiency and the yield, and meanwhile, due to the advantage of ensuring the design of the epitaxial structure, the product performance is prevented from being influenced by errors in process manufacturing.

Description

technical field [0001] The present application relates to the technical field of semiconductors, in particular to a semiconductor device and a manufacturing method thereof. Background technique [0002] With the development of data information, the requirements for signal transmission tend to be higher speed and higher quality. In response to the improvement of communication demand, the Ministry of Industry and Information Technology of China has issued 5G licenses to relevant mobile telecom operators in June 2019. This move means that the commercialization of the fifth generation mobile communication technology solution (5th Generation Wireless System, referred to as 5G) is underway. In order to quickly deploy the 5G communication system, the design scheme of the 5G wireless communication base station in the fronthaul part is a part of the entire communication system that has attracted much attention. Multiplexing) and the newly proposed 12-wavelength MWDM (MetroWavelength...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): H01S5/34H01S5/343H01L33/06
CPCH01L33/06H01S5/3406H01S5/34313H01S5/34366
Inventor 潘彦廷靳晨星刘钿师宇晨
Owner SHANXI YUANJIE SEMICONDUCTOR TECH CO LTD