Semiconductor device and preparation method thereof
A semiconductor and device technology, applied in the field of semiconductor devices and their preparation, can solve the problems of large channel spacing, increased energy costs, increased energy loss of optical modules, etc.
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[0099] Based on the same inventive concept, the present application provides a semiconductor device preparation method, comprising the following steps:
[0100] S10, providing a substrate 10, and growing a buffer layer 11 and a first confinement layer 12 on the surface of the substrate 10;
[0101] S20, on the surface of the first confinement layer 12 away from the substrate 10, the first quantum well layer 131 and the barrier layer 132 are stacked and grown sequentially, and the second quantum well layer 133 and the barrier layer 132 are stacked alternately, to generate the active layer 13;
[0102] S30, growing a second confinement layer 14 on the surface of the active layer 13 away from the first confinement layer 12;
[0103] Wherein, the wavelength difference between the first quantum well layer 131 and the second quantum well layer 133 is 10 nm to 20 nm.
[0104] In this embodiment, the semiconductor epitaxial structure preparation method adopts MOCVD to grow the buffe...
Embodiment 1
[0113] In this embodiment, the purpose of improving the 50°C bandwidth of the LWDM channel 4 is achieved by optimizing the number of the first quantum well layer 131 in the active region, and there are four other parameters that need to be optimized, namely, the number of the second quantum well layer 133, the number of the second quantum well layer 133, The thickness of the quantum well, the stress of the quantum well and the potential barrier, and the wavelength difference between the first quantum well layer 131 and the second quantum well layer 133 , these four parameters will be optimized and designed one by one in the embodiments 2 to 5 respectively. In Example 1, the thickness of the quantum well will first take near the middle value of the value range (that is, the thickness is 60 Å), and the stress of the quantum well and the potential barrier will first take the middle value near the larger value range (that is, the quantum well compressive stress +1.0% and barrier te...
Embodiment 2
[0115] In this embodiment, the number of the second quantum well layer 133 in the active region is optimized to ensure that the 50°C bandwidth of the LWDM channel 1 is greater than 19 GHz, such as Figure 11 As shown, the number of the first quantum well layer 131 in Example 1 is within the range of 5 to 7, and when the number of the second quantum well layer 133 is within the range of 4 to 5, all of them can meet the 50°C temperature of the LWDM channel 1. The bandwidth requirement is 19GHz, wherein, when the number of the first quantum well layer 131 is 6 and the number of the second quantum well layer 133 is 5, the bandwidth value is 19.7GHz, so the number of the second quantum well layer 133 is 5. The best value of the example. .
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