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Analysis method of atomic force microscope combined with ultrafast scanning calorimeter

A technology of atomic force microscope and scanning calorimeter, which is applied in the field of material analysis, can solve the problems of no atomic force microscope analysis system and method, and achieve the effect of important theoretical research and experimental application value

Pending Publication Date: 2021-06-18
NANJING UNIV +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] At present, there is no analysis system and method combining atomic force microscope with ultrafast scanning calorimeter on the market

Method used

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  • Analysis method of atomic force microscope combined with ultrafast scanning calorimeter
  • Analysis method of atomic force microscope combined with ultrafast scanning calorimeter
  • Analysis method of atomic force microscope combined with ultrafast scanning calorimeter

Examples

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Effect test

Embodiment 1

[0035] like Figure 4 A device that integrates an atomic force microscope and an ultrafast scanning calorimeter is shown, including an atomic force microscope AFM (Level AFM from Anfatec, Germany), FSC electronic components, a sample sensor, and a reference sensor, wherein the sample sensor is XI393 and XI394 series supported by TO5, the structure is as follows figure 1 As shown, it includes a TO5 copper substrate 4, a chip 6 and a bendable copper pin 5. The sample sensor is fixed above the piezoelectric scanner of the atomic force microscope through the sample sensor bracket. The structure of the sample sensor bracket 1 is as follows figure 2 shown, combined with image 3 It can be seen that it is a cylindrical groove, which is set on the piezoelectric scanner 3 , and the sample sensor is placed in the groove and fixed by the screw 2 . The bendable copper pin 5 of the sample sensor is connected to the FSC electronic component using a pin type circuit connector, and the FSC...

Embodiment 2

[0040] like Figure 5 An analysis system of an atomic force microscope combined with an ultrafast scanning calorimeter is shown, including an atomic force microscope, a sample sensor, a reference sensor, FSC electronic components, and a computer control terminal. The sample sensor is placed above the scanner of the atomic force microscope and connected to the FSC The electronic components are connected, the FSC electronic components are also connected with the reference sensor, and the atomic force microscope and the FSC electronic components are respectively connected to the computer control terminal. Also included is a thermostat that regulates the environment of the AFM located outside the AFM. Among them, the atomic force microscope is the Level AFM of Anfatec Company in Germany. The sample sensors are XI393 and XI394 series supported by TO5. Ultrafast Scanning Calorimeter FSC includes SRS amplifier and NI data acquisition board.

[0041] The method of analysis using th...

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Abstract

The invention discloses an atomic force microscope and ultrafast scanning calorimeter combined analysis method, which comprises the following steps of: (1) arranging a sample on a sample sensor, and fixing the sample sensor above an atomic force microscope scanner to ensure that the scanning of the atomic force microscope is not influenced; (2) connecting a circuit, adjusting the position of a probe of a sample sensor, selecting a sample area needing to be scanned, opening a temperature control device, adjusting the temperature to a specified temperature, and introducing dry nitrogen; and (3) starting an FSC experiment after the environment temperature is stable, and performing structure scanning on the sample by using an AFM after heat treatment is completed, so as to realize tracking characterization of the nucleation and crystallization processes of the sample. According to the analysis method, in-situ FSC-AFM characterization becomes possible, sample structures in different states can be obtained through ultra-fast heating and cooling scanning and isothermal heat treatment of FSC, the formation and growth process of a single spherocrystal can be tracked and characterized, and the analysis method has important theoretical research and experimental application value.

Description

technical field [0001] The invention belongs to material analysis technology, in particular to an analysis method of an atomic force microscope combined with an ultrafast scanning calorimeter. Background technique [0002] With the development of ultra-high-speed heating and cooling heat treatment technology, ultra-fast scanning calorimeter FSC has become one of the indispensable technologies in the field of materials. up to 10 7 The heating and cooling rate of K / s can more accurately study the dynamic processes of rapid crystallization kinetics, crystallization recombination, melting and glass transition of various materials (including metal alloys, polymers, biomedicine, etc.), and obtain important nucleation and crystal growth kinetics data. However, calorimetry data cannot provide the most intuitive structural characterization analysis in the theoretical study of crystal nucleation and growth, and it needs to be combined with other structural characterization technique...

Claims

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Application Information

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IPC IPC(8): G01N25/20G01Q60/24G01Q30/10G01Q30/18G01Q30/00
CPCG01N25/20G01Q60/24G01Q30/10G01Q30/18G01Q30/00
Inventor 姜菁朱逸夫周东山张睿
Owner NANJING UNIV
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