Electronic component test system and test method based on virtual instrument

Abstract

The invention belongs to the field of instruments and meters and virtual instruments, and discloses an electronic component test system and test method based on a virtual instrument, and the electronic component test system based on the virtual instrument comprises a test control system, a data acquisition unit, a data communication unit, a signal generation unit and an equipment interface. A hardware system circuit of the electronic component test system based on the virtual instrument comprises a power supply module circuit, a function signal generation circuit, a parameter measurement circuit and a WIFI circuit. The system is a comprehensive system integrating the functions of parameter measurement, function signal generation, intelligent information processing, multifunctional assistance and the like, integrates the technologies of computers, virtual instruments, information fusion, communication, power electronics and the like, is a typical high and new technology complex, and is low in price, easy to operate, small in size, powerful in function, convenient to carry, and diversified in function, the test efficiency is effectively improved, and the system has wide use value and application prospect.

Description

technical field [0001] The invention belongs to the fields of instruments and meters and virtual instruments, and in particular relates to a virtual instrument-based electronic component testing system and testing method. Background technique [0002] At present, the functions of the control system are becoming more and more complex. Most of the peripheral circuits of electronic products are composed of resistors, capacitors, inductors, diodes, etc. It is often necessary to measure their size and function signals in product design and equipment maintenance testing. Sources are simulated and tested. [0003] The most similar existing technology to this scheme: in the measurement of circuit and component parameters, the most widely used at present is the multimeter, which is simple in structure and easy to carry, but it is in the range and accuracy when measuring inductance and capacitance parameters. The performance is greatly reduced, and it is impossible to send out functi...

AI Technical Summary

Problems solved by technology

[0005] (1) In the existing measurement methods for circuit and capacitance and inductance component parameters, the multimeter has greatly reduced the range and accuracy, and cannot send function signals for simulation and testing

[0006] (2) The signal generation sources and oscilloscopes commonly used in existing laboratories are bulky, expensive, and inconvenient to carry; at the same time, user interaction and function modification are also inconvenient

[0007] (3) At present, the cost of the data acquisition card supporting LabVIEW is relatively high, which makes it difficult for many users to accept

[0011] The computer interface designed by LabVIEW replaces the LCD screen display of traditional instruments, improves human-computer interaction, reduces costs, and increases the difficulty of system software design; integrates the functions of voltage, resistance, inductance, capacitance measurement and function signal generation In a system, when there are many hardware circuits, it is necessary to design the corresponding circuit diagram and have better anti-interference ability, and it will be difficult to process digital signals and analog signals.

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