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Manufacturing method and detection method of thin film packaging Test key

A technology of thin film encapsulation and manufacturing method, applied in the field of OLED displays, can solve the problems of low brightness, easy failure of encapsulation structure, short life of OLED displays, etc.

Pending Publication Date: 2021-12-10
FUJIAN HUAJIACAI CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The organic light-emitting materials in OLED displays, the cathode and anode metal materials are extremely sensitive to water and oxygen, so a packaging structure is required to protect the OLED display. Due to the trend of thinning and thinning, the packaging structure is also prone to failure due to the erosion of water and oxygen. Causes the failure of the internal functional layer of the OLED device, which in turn leads to abnormalities such as short life and low brightness of the OLED display; for this reason, we propose a production method and detection method of a thin-film package Test key to solve the problems mentioned in the background technology above.

Method used

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  • Manufacturing method and detection method of thin film packaging Test key

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Embodiment 1

[0036] A method for detecting a thin-film packaged test key is applied to a film-packaged test key structure prepared by a method for producing a thin-film packaged test key. A water-oxygen detection test key structure of the invention includes Figure 4 The anode 4, the cathode (i.e. the Mg cathode 6 and the Ag cathode 7), the thin-film encapsulation layer (i.e. the first water-oxygen barrier layer 8, the organic buffer layer 9 and the second water-oxygen barrier layer 10), such as Figure 4 , where B represents the direction of water and oxygen intrusion;

[0037] The detection method is to detect the change in the transmittance of the test key by testing water and oxygen, and feedback the degree of water and oxygen intrusion. When water and oxygen penetrate into the anode 4 and cathode from the gap in the film packaging layer, since the anode 4 is made of ITO / Ag / ITO composition, when water and oxygen enter, Ag is easily oxidized into silver oxide by water and oxygen, and t...

Embodiment 2

[0039] A method for detecting a thin-film packaged test key is applied to a film-packaged test key structure prepared by a method for producing a thin-film packaged test key. A water-oxygen detection test key structure of the invention includes Figure 4 The anode 4, the cathode (i.e. the Mg cathode 6 and the Ag cathode 7), the thin film encapsulation layer (i.e. the first water-oxygen barrier layer 8, the organic buffer layer 9 and the second water-oxygen barrier layer 10), the detection method is through Test the resistance value change of the water and oxygen detection test key, and feedback the degree of water and oxygen intrusion. When water and oxygen penetrate into the anode 4 and the cathode from the gap in the film encapsulation layer, since the anode 4 is composed of ITO / Ag / ITO, when water After oxygen enters, Ag is easily oxidized by water and oxygen into silver oxide, in which the resistance of silver oxide and metal silver is different, and the laminated layer of t...

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Abstract

The invention discloses a manufacturing method and detection method of a thin film package Test key. The manufacturing method comprises S1, a TFT driver is prepared on a glass substrate, when the TFT driver is prepared, a substrate layer in the edge of the glass substrate and a SiNx layer in the TFT driver are on the same layer, that is, when the TFT driver is prepared, the SiNx layer deposited on the edge of the glass substrate forms the substrate layer, then a pixel definition layer is prepared on the TFT driver, the pixel definition layer is exposed, developed, etched and demolded to form a pattern, and then a layer of anode is sputtered at an opening of the pixel definition layer; S2, an OLED light-emitting device is prepared on the basis of the step S1, then cathodes are prepared on the OLED light-emitting device, and the cathodes comprise the Mg cathode and the Ag cathode; and S3, a thin film packaging layer is deposited on the basis of the step S2. The method can be used for efficiently and quickly detecting whether the OLED display packaged by the thin film fails or not and the water-oxygen erosion degree, provides a direction for subsequent maintenance and use, and has great significance in the aspect of device development.

Description

technical field [0001] The invention belongs to the technical field of OLED displays, and in particular relates to a manufacturing method and a detection method of a film-encapsulated Test key. Background technique [0002] Organic Light Emitting Diode (Organic Light Emitting Diode) OLED display has the characteristics of low power consumption, wide viewing angle, fast response speed, ultra-light and thin, good shock resistance, wide operating temperature range, and can realize flexible display and large-area full-color display And many other advantages, it is recognized by the industry as the display device with the most development potential; [0003] In the preparation of OLED devices, the light-emitting layer is usually made of polymers, and the cathode is made of active metal magnesium and silver. These materials are very sensitive to water and oxygen. The penetration of water / oxygen into OLED devices has a great impact on the life of OLEDs. Therefore, in order to achi...

Claims

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Application Information

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IPC IPC(8): H01L21/77H01L51/52H01L21/66
CPCH01L22/12H01L22/20H10K71/70H10K50/844H10K59/1201Y02E10/549
Inventor 温质康乔小平苏智昱
Owner FUJIAN HUAJIACAI CO LTD
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