The invention discloses a manufacturing method and detection method of a thin film
package Test key. The manufacturing method comprises S1, a TFT driver is prepared on a glass substrate, when the TFT driver is prepared, a substrate layer in the edge of the glass substrate and a SiNx layer in the TFT driver are on the same layer, that is, when the TFT driver is prepared, the SiNx layer deposited on the edge of the glass substrate forms the substrate layer, then a pixel definition layer is prepared on the TFT driver, the pixel definition layer is exposed, developed, etched and demolded to form a pattern, and then a layer of
anode is sputtered at an opening of the pixel definition layer; S2, an
OLED light-emitting device is prepared on the basis of the step S1, then cathodes are prepared on the
OLED light-emitting device, and the cathodes comprise the Mg
cathode and the Ag
cathode; and S3, a thin film packaging layer is deposited on the basis of the step S2. The method can be used for efficiently and quickly detecting whether the
OLED display packaged by the thin film fails or not and the water-
oxygen erosion degree, provides a direction for subsequent maintenance and use, and has great significance in the aspect of device development.