Method for carrying out specific heat test by utilizing synchronous thermal analyzer

Abstract

The invention discloses a method for carrying out specific heat testing by utilizing a synchronous thermal analyzer, and relates to the field of material specific heat testing. In order to solve the problem that a conventional synchronous thermal analyzer only has a high-temperature furnace, a material is directly subjected to a temperature rise test in a test process, and the change of a low-temperature or normal-temperature phase structure cannot be tested, so that a specific heat measurement result is inaccurate. The test method comprises the following specific measurement steps: cleaning a sample, and then putting the sample into a sample chamber of a synchronous thermal analyzer; vacuumizing the sample chamber and then introducing helium to purify the sample chamber; 3, weighing the mass of the sample by using a balance; 4, reducing the temperature in the sample chamber to an initial temperature by using a liquid nitrogen device, then raising the temperature to a test initial temperature and keeping the temperature, raising the temperature to a final temperature at a constant temperature raising rate and keeping the temperature, and recording a heat flow result of the sample in the heating process; and 5, testing the standard sample by adopting the steps to obtain a heat flow result. The device is mainly used for measuring the specific heat capacity of the material.

Description

technical field [0001] The invention relates to the technical field of material specific heat capacity testing, in particular to a method for testing specific heat using a synchronous thermal analyzer. Background technique [0002] Thermophysical properties are crucial for the preparation of crystalline materials and their future applications. The physical nature of various thermal properties of materials is related to lattice thermal vibration. The larger the specific heat of the crystal, the higher the light damage threshold. The crystal dissipates heat by surface cooling, and the cooling efficiency depends on the thermal diffusivity and thermal conductivity of the crystal, and the specific heat is an important physical parameter for calculating thermal conductivity. [0003] In the process of measuring the specific heat of the material by the existing method, the mass needs to be weighed in the air atmosphere outside the instrument, resulting in inaccurate measurement r...

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Problems solved by technology

[0004] The technical problem to be solved by the present invention is: since the previous synchronous thermal analyzer only has a high-temperature furnace, the material is directly subjected to a temperature rise test during the test process, so it is impossible to test the phase structure change at low temperature or normal temperature, and it is impossible to realize the temperature of the low temperature section. The stability and repeatability of the DSC curve lead to inaccurate measurement results of specific heat; and then provide a method for specific heat measurement using a synchronous thermal analyzer

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