Compact liquid film thickness and temperature synchronous measurement system

A technology for simultaneous measurement of liquid film thickness, applied in thermometers, measuring heat, measuring devices, etc., can solve the problems of large influence, many optical components, large space occupation, etc., to achieve simple and compact structure, accurate measurement results, and reduced size The effect of light intensity attenuation

Pending Publication Date: 2022-07-08
UNIV OF SHANGHAI FOR SCI & TECH
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  • Abstract
  • Description
  • Claims
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AI Technical Summary

Problems solved by technology

The device provided by the prior art has many optical components, takes up a large space, and is complicated to arrange and debug. Especially when performing wavelength separation, the construction of the optical path has high requirements on the position and angle of the optical components, which is not easy to operate
In addition, the laser light source and detector are greatly affected by the measured liquid medium, and cannot measure liquid media with unknown absorption positions, which is not universal

Method used

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  • Compact liquid film thickness and temperature synchronous measurement system
  • Compact liquid film thickness and temperature synchronous measurement system

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Embodiment Construction

[0024] In order to make the technical means, creative features, goals and effects realized by the present invention easy to understand, the following embodiments will specifically describe the compact liquid film thickness and temperature synchronous measurement system of the present invention in conjunction with the accompanying drawings.

[0025]

[0026] figure 1 It is a schematic structural diagram of a compact liquid film thickness and temperature synchronous measurement system in an embodiment of the present invention.

[0027] like figure 1 As shown, the compact liquid film thickness and temperature synchronous measurement system 100 includes a halogen light source 10, a fiber collimator 20, a filter 30, a cuvette 40, a convex lens 50, a fiber probe 60, a spectrometer 70, a computer 80, and a water bath heating device (not shown in the figure).

[0028] In this embodiment, the liquid medium to be tested is deionized water.

[0029] The halogen light source 10 is us...

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Abstract

The invention provides a compact liquid film thickness and temperature synchronous measurement system, which is characterized by comprising a halogen light source used for emitting white light; the optical fiber collimator is connected with the halogen light source and is used for collimating the white light; the optical filter is used for filtering the white light; the cuvette is used for bearing a liquid medium to be detected; the convex lens is used for converging the light beams penetrating through the liquid medium; the optical fiber probe is used for receiving light beams converged by the convex lens; the spectrograph is connected with the optical fiber probe through an optical fiber and is used for converting an optical signal into an electric signal; the computer is electrically connected with the spectrograph and used for collecting and processing electric signals, the halogen light source is a broadband light source, the optical filter filters optical signals outside the response range of the spectrograph, the optical filter is arranged between the optical fiber collimator and the cuvette, and the convex lens is arranged between the cuvette and the optical fiber probe.

Description

technical field [0001] The invention relates to the field of liquid film measurement, in particular to a compact liquid film thickness and temperature synchronous measurement system. Background technique [0002] The measurement of liquid film-related parameters in falling film flow is very important in industrial processes. Taking the water film formed on the surface of the shell by spraying the containment tank of a passive containment cooling system in the nuclear industry as an example, its thickness and coverage It is closely related to ensuring the safety of the reactor. High-precision quantitative analysis of key parameters such as liquid film thickness and temperature not only provides a better understanding of liquid film formation, flow, and evaporation processes, but also has far-reaching significance for optimizing various industrial processes involved. [0003] In the existing patent (ZL201410304521.6), the optical path of the liquid film temperature and thickn...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01K11/32G01B11/06
CPCG01K11/32G01B11/06Y02E30/30
Inventor 孙昊杨荟楠黄未罗超侯永李思龙孔帅帅
Owner UNIV OF SHANGHAI FOR SCI & TECH
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