Etchant and etching method
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- MITSUBISHI CHEM CORP
- Publication Date
- 2006-07-05
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The present invention relates to an etchant for forming a pattern on a thin metal film by wet etching and an etching method using the etchant. More specifically, the present invention relates to an etchant and an etching method for etching a multilayer film including an aluminum alloy layer and a molybdenum-niobium alloy layer. Background technique
[0002] Recently, electrodes and gate wiring materials used in semiconductor devices such as semiconductor elements and liquid crystal display elements are increasingly required to have a higher degree of microfabrication accuracy. In addition, it has been proposed to use metallic materials with lower electrical resistance. Examples of metal materials having lower resistance include aluminum and aluminum alloys, and these materials are being used more and more.
[0003] Examples of techniques used to process thin films of the metal to form microstructures such as wiring include wet etching techniques in w...