Method and apparatus for detecting ionizing radiation

Abstract

A method for detecting ionizing radiation with the aid of a scintillation counter and a photomultiplier using an inorganic solid-matter scintillator that incorporates at least one decay time component greater than 100 ns and measures the photons emitted by the scintillator with a fast single-photon counter. The single-photon counter is composed of a fast photomultiplier with high internal amplification, a stabilized high-voltage supply and a fast amplifier / discriminator with standard pulse output. With this arrangement, the measurement of all types of radiation, like alpha, beta, gamma and X radiation, can be performed, with low manufacturing costs for the detector, a high degree of sensitivity especially with regard to low beta energies, only small sensitivity changes over a large temperature range of −20 to +50 degrees C., and good long-term stability.

Description

BACKGROUND OF THE INVENTION [0001] 1. Technical Background [0002] The invention relates to a method and an apparatus for scintillation counting of ionizing radiation. [0003] In radionuclide laboratories, in nuclear facilities and in general radiation protection, measurements are regularly conducted, e.g., for establishing radioactive contamination or the dose rate, as well as for activity measuring. [0004] In process measurement technology, such as for measuring fill level, density, or weight per unit area, nuclear measuring processes are widely used as well. The detectors that are utilized are especially scintillation counters, counting tubes and ionization chambers. [0005] 2. Prior Art [0006] The publication by KNOLL, entitled “Radiation detection and measurement”, 2nd edition (p. 231 and 237) discloses that ZnS, and specifically ZnS(Ag), is the material of choice for detection of alpha radiation and has a high light output in response to that radiation. In contrast, ZnS(Ag) is ap...

AI Technical Summary

Benefits of technology

[0014] The present invention lies in the conception of a measuring system with low manufacturing costs for the detector, with the goal of increasing the sensitivity of the measuring system, especially in the case of low beta energies, with only slight sensitivity changes in a large temperature range of −20 to +50° C., as well as with good long-term stability.

[0016] Surprisingly, combining one single scintillator that is provided with decay time components of over 100 ns, and thus permits a time resolution of the single photon pulses, with a single-photon counter permits the measurement of all types of radiation, such as alpha, beta, gamma and X-radiation. The term single-photon counter refers to a detector for photons, preferably in the visible range or in the near ultraviolet or infrared. It is composed of a fast photomultiplier with high internal amplification, which is achieved, among other things, with a large number of dynodes (e.g., 10), a stabilized high-voltage supply and a fast amplifier / discriminator with standardized pulse output. A single-photon counter may also use a semiconductor component with internal amplification, e.g., an avalanche photodiode, in place of a photomultiplier.

[0019] A scintillator with the above properties can be produced relatively easily either by sedimentation with a suitable solution or by application using a spray gun, known per se, which decisively reduces the manufacturing costs of the detector and, hence, those of the measuring system.

Problems solved by technology

In contrast, ZnS(Ag) is apparently not suitable for detection of other types of radiation.

This is not possible, however, with surface-contamination monitors since the scintillators have surface areas of typically 100-200 cm2, whereas the inlet windows of preferred photomultipliers have a diameter of only approximately 25 mm.

One also no longer obtains a visible plateau in this case, i.e., no stable operating point in dependence upon the pulse rate as a function of the high voltage.

Plastic scintillators with ZnS(Ag) coating additionally require a special and complex manufacturing process and, consequently, high costs for the detector and thus for the measuring system.

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