Abrasive tool and method of making the same
Patent Information
- Authority / Receiving Office
- US · United States
- Current Assignee / Owner
- KINIK
- Publication Date
- 2006-11-16
- Estimated Expiration
- Not applicable · inactive patent
Smart Images

Figure 1 
Figure 2 
Figure 3
Abstract
Description
BACKGROUND OF THE INVENTION
[0001] 1. Field of Invention
[0002] The invention relates to an abrasive tool and the method of making the same. In particular, the invention relates to a diamond abrasive tool and the method of making the same.
[0003] 2. Related Art
[0004] In the manufacturing process of deep sub-micro semiconductor devices, the planarization technique for the oxide layer and the metal layer on the surface of wafer becomes important along with the development in the wire miniaturization and the multiple metal connection technique. In order to have a dense circuit in a small area, the thickness and flatness in each layer of the wafer are strictly demanded.
[0005] The chemical mechanical polishing (CMP) technique employs slurry and polish pad, along with mechanical polishing, to planarize the oxide layer and the metal layer of a wafer. This method can remove limitations in the layout design, increase the pattern density, reduce the defect density, and promote the yield. In...