Semiconductor laser element
a laser element and semiconductor technology, applied in semiconductor lasers, laser output parameters control, laser details, etc., can solve the problem of strong magnetic field required for writing, and achieve the effect of small chip size and high output power
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first embodiment
[1] First Embodiment
[0083]FIG. 1 is a perspective view of an outer appearance of a semiconductor laser element according to a first preferred embodiment of the present invention. FIG. 2 is a front view of the semiconductor laser element of FIG. 1. FIG. 3 is a plan view of the semiconductor laser element of FIG. 1. FIG. 4 is a bottom view of the semiconductor laser element of FIG. 1. FIG. 5 is an illustrative sectional view taken along line V-V of FIG. 3. FIG. 6 is an illustrative sectional view taken along line VI-VI of FIG. 3.
[0084]This semiconductor laser element 60 is of a Fabry-Perot type that includes a substrate 1, a semiconductor laminated structure (semiconductor laminated structure in the narrow sense) 2 that is formed by crystal growth on the substrate 1, an n side electrode 3 that is formed such as to contact a rear surface (surface at an opposite side to the semiconductor laminated structure 2) of the substrate 1, and a p side electrode 4 that is formed such as to contac...
second embodiment
[2] Second Embodiment
[0140]FIG. 21 is a sectional view of a semiconductor laser element according to a second preferred embodiment of the present invention and is a sectional view corresponding to the section plane of FIG. 6. In FIG. 21, portions corresponding to respective portions in FIG. 6 described above are indicated by attaching the same symbols as in FIG. 6.
[0141]In comparison to the semiconductor laser element 60 of FIG. 1 to FIG. 6, the present semiconductor laser element 60A differs just in the point that the p type contact layer 21 in the semiconductor laser element 60 is not provided. That is, this semiconductor laser element 60A has the p side electrode 4 formed on front surfaces of the capping layer 20 and the current constriction layers 5.
third embodiment
[3] Third Embodiment
[0142]FIG. 22 is a sectional view of a semiconductor laser element according to a third preferred embodiment of the present invention and is a sectional view corresponding to the section plane of FIG. 6. In FIG. 22, portions corresponding to respective portions in FIG. 6 described above are indicated by attaching the same symbols as in FIG. 6.
[0143]In comparison to the semiconductor laser element 60 of FIG. 1 to FIG. 6, the p type contact layer 21 in the semiconductor laser element 60 is not provided in the present semiconductor laser element 60B. Further, with the semiconductor laser element 60B, the current constriction layers 5 differ from the current constriction layers 5 of the semiconductor laser element 60.
[0144]Each current constriction layer 5 is constituted of a first layer 51 oriented along a front surface of the p type InGaP etching stop layer 17 and a second portion 52 oriented along the side surfaces of the ridge 30. The current constriction layer 5...
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Abstract
Description
Claims
Application Information
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