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Semiconductor substrate, semiconductor device, light emitting diode and producing method therefor

A technology for light-emitting diodes and a manufacturing method, which is applied in the manufacturing of semiconductor/solid-state devices, semiconductor devices, semiconductor lasers, etc., can solve the problems of difficulty in uniformly controlling the thickness of semiconductor stack parts and impossible to fully utilize

Inactive Publication Date: 2008-04-16
CANON KK
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In this removal method by grinding, it is difficult to uniformly control the thickness of the semiconductor stacked part, and it is impossible to fully utilize the advantages of compound semiconductor devices

Method used

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  • Semiconductor substrate, semiconductor device, light emitting diode and producing method therefor
  • Semiconductor substrate, semiconductor device, light emitting diode and producing method therefor
  • Semiconductor substrate, semiconductor device, light emitting diode and producing method therefor

Examples

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Effect test

example 1

[0070] First, a P-type Ge substrate 11 having a specific resistivity of 0.01 Ω·cm was prepared. Then, the Ge substrate 11 was anodized in an anodizing solution, thereby forming a porous Ge layer as the separation layer 12 . The anodizing conditions are as follows:

[0071] Current density: 6(mA / cm 2 )

[0072] Anodizing solution: HF:H 2 O:C 2 h 5 OH=1:1:1

[0073] Cycle: 11(minutes)

[0074] Thickness of porous Ge: 12 μm.

[0075] The current density and the concentration of the anodizing liquid can be appropriately changed according to the thickness and structure of the separation layer (porous Ge layer) 12 to be formed. The current density is preferably 0.5-700mA / cm 2 Within the range, the concentration of the anodizing solution is preferably in the range of 1:10:10 to 1:0:0.

[0076] The porous Ge layer is effective as a relaxation layer for forming a high-quality epitaxial GaAs layer thereon and as a separation layer.

[0077] The anodizing solution may be a sol...

example 2

[0098] This example is a development of Example 1 and provides a method of manufacturing a semiconductor device. First, use the same as in Example 1 figure 1 and 2 A porous Ge layer 22 is formed on a Ge substrate 21 in the same manner as shown.

[0099] Then, if Figure 8 As shown, the n-GaAs layer 23 is epitaxially grown on the porous Ge layer 22, and then the n-AlGaAs layer 24 as the n-cladding layer, the GaAs layer 25 as the active layer, and the GaAs layer as the p-clad AlGaAs layer 26 to form laser structure 50 .

[0100] Then, using the same as Example 1's Figure 4 In the same manner as shown, the surface of the p-AlGaAs layer 26 of the laser structure 50 is laminated and bonded to the surface of an additionally prepared substrate 20 . Although not shown, electrodes are formed on the substrate 20 and are electrically connected to the p-AlGaAs layer 26 . The porous Ge layer having a large surface area has an impurity removal function to remove impurities that migr...

example 3

[0105] In Example 3, two porous germanium layers 102, 103 are first formed on a germanium substrate 101 by anodizing, as Figure 10 shown. Since the porous layer formed by anodizing is formed from the surface, the porous germanium layer 103 with a lower porosity is formed first, and then the porous germanium layer with a larger porosity is formed. This process can facilitate the next step of closing the pinholes existing on the surface before epitaxial growth, and can smoothly separate the germanium substrate 101 in the later step.

[0106] Subsequently, high-temperature hydrogen annealing and the use of GeH 4 、GeCl 4 The CVD process as the raw material gas closes the pores existing on the surface of the porous germanium layer, thereby forming a satisfactory crystalline surface on the surface of the porous germanium, and sequentially epitaxially grows the single crystal germanium layer 104, the n-GaAs layer 105, n-Al x Ga 1-x As layer 106, n-Al y Ga 1-y As layer 107, n-...

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Abstract

PROBLEM TO BE SOLVED: To provide a manufacturing method of a semiconductor substrate having a gallium arsenide layer. ŽSOLUTION: The manufacturing method of the semiconductor substrate having the gallium arsenide layer comprises a step wherein a first substrate 10 having a separating layer 12 made of germanium and a gallium arsenide layer 13 on the separating layer is manufactured, a step wherein the first substrate 10 is bonded to a second substrate 20 to manufacture a bonded substrate 30 and a step wherein the bonded substrate is divided at the separating layer 12. Ž

Description

technical field [0001] The invention relates to a semiconductor substrate with a gallium arsenide layer, a semiconductor device, a light emitting device and a manufacturing method thereof. Background technique [0002] A semiconductor device on a compound semiconductor substrate such as gallium arsenide exhibits high performance, such as excellent high speed and light emitting performance, which cannot be obtained on silicon. However, compound semiconductor substrates have disadvantages such as high price, low mechanical strength, and difficulty in preparing large-scale substrates. [0003] Due to these facts, attempts have been made to grow compound semiconductors heteroepitaxially on silicon substrates having high mechanical strength and large size which are readily available. For example, Japanese Patents JP3157030, 3237889, and 3237890 disclose a method of heteroepitaxially growing a compound semiconductor layer on a porous silicon layer formed on a silicon substrate, a...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): C30B29/42C30B25/22H01L21/20H01L33/00H01S5/323
Inventor 米原隆夫关口芳信
Owner CANON KK