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Silicon solar battery antireflective thin film

A silicon solar cell and anti-reflection technology, applied in circuits, electrical components, semiconductor devices, etc., can solve problems such as non-ideal refractive index and lack of surface passivation performance, so as to improve cell efficiency, reduce light absorption loss, and improve surface The effect of the passivation effect

Inactive Publication Date: 2007-08-22
JIANGSU AIDE SOLAR ENERGY TECH CO LTD
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  • Abstract
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  • Application Information

AI Technical Summary

Problems solved by technology

Although this kind of film has almost no light absorption loss, the surface passivation performance is lacking (the surface recombination speed is more than twice that of silicon-rich silicon nitride film), and the refractive index is not ideal.

Method used

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Experimental program
Comparison scheme
Effect test

Embodiment 1

[0022] In the first embodiment, two silicon nitride films with different compositions are used. Two layers of silicon nitride films with different compositions are deposited on the front surface (diffusion surface) of the silicon wafer. The deposition method can be PECVD. First deposit a silicon-rich silicon nitride film with a thickness of 5 nanometers, a chemical composition of SiNx:H, X=0.9, and a corresponding refractive index of 2.5. Then, a silicon nitride film with a composition close to stoichiometric ratio is deposited on the silicon-rich silicon nitride film, with a thickness of 65 nanometers, a chemical composition of SiNx:H, X=1.33, and a corresponding refractive index of 2.0. The relationship between the thickness and the refractive index of the above-mentioned double-layer film satisfies the principle of minimizing surface light reflection.

Embodiment 2

[0023] In the second embodiment, two or more layers of silicon nitride films with different compositions are used. Among them, a silicon-rich film with a high silicon content is first deposited, with a thickness of 10 nanometers, a chemical composition of SiNx:H, X=1.1, and a corresponding refractive index of 2.2. A transition layer of silicon nitride is then deposited. Finally, a silicon nitride film with a composition close to the stoichiometric ratio is deposited, with a thickness of 50 nanometers, a chemical composition of SiNx:H, X=1.8, and a corresponding refractive index of 1.8. The silicon nitride transition layer has a refractive index between the lowermost layer and the uppermost silicon nitride film, has a thickness of 25 nanometers, and has a silicon content between the lowermost layer and the uppermost silicon nitride film. In the third embodiment, a silicon nitride film with a graded composition is used. The chemical composition of the thin film deposited on th...

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Abstract

This invention discloses an anti-reflection film of silicon solar cell used in solar cells by depositing a rich silicon SiN film on the positive surface of a silicon chip and a SiN film with ideal match on the rich silicon SiN film, in which, and the film content closing to the Si chip surface is high and the surface pasivation effect is better than the SiN film approaching to the idea match, the surface composition speed is more than one time less than the normal matched SiN film, and the rich Si film is thin and only absorbs 20%-30% short waves with the wavelength about 300nm and does not absorb long-middle lightwaves and other composition approaches to ideal chemical match.

Description

technical field [0001] The invention relates to a silicon nitride anti-reflection film used for solar cells. Background technique [0002] Silicon nitride anti-reflection films are widely used in crystalline silicon (including single crystal silicon and polycrystalline silicon) solar cells. Usually, silicon nitride is prepared by plasma enhanced chemical vapor deposition (PECVD) or sputtering, of which PECVD is the most widely used. During PECVD deposition, silicon nitride films also contain hydrogen as a by-product of the reaction. Silicon nitride thin film mainly has the following functions in crystalline silicon solar cells: [0003] 1) Anti-reflection effect. Generally, the refractive index of silicon nitride is 1.9 to 2.3. Using a silicon nitride film with a suitable refractive index and thickness can greatly reduce the reflection of light by the solar cell, thereby improving the photoelectric conversion rate of the solar cell. [0004] 2) Surface passivation. The s...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L31/0216
Inventor 励旭东
Owner JIANGSU AIDE SOLAR ENERGY TECH CO LTD
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