Silicon solar battery antireflective thin film
A silicon solar cell and anti-reflection technology, applied in circuits, electrical components, semiconductor devices, etc., can solve problems such as non-ideal refractive index and lack of surface passivation performance, so as to improve cell efficiency, reduce light absorption loss, and improve surface The effect of the passivation effect
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Embodiment 1
[0022] In the first embodiment, two silicon nitride films with different compositions are used. Two layers of silicon nitride films with different compositions are deposited on the front surface (diffusion surface) of the silicon wafer. The deposition method can be PECVD. First deposit a silicon-rich silicon nitride film with a thickness of 5 nanometers, a chemical composition of SiNx:H, X=0.9, and a corresponding refractive index of 2.5. Then, a silicon nitride film with a composition close to stoichiometric ratio is deposited on the silicon-rich silicon nitride film, with a thickness of 65 nanometers, a chemical composition of SiNx:H, X=1.33, and a corresponding refractive index of 2.0. The relationship between the thickness and the refractive index of the above-mentioned double-layer film satisfies the principle of minimizing surface light reflection.
Embodiment 2
[0023] In the second embodiment, two or more layers of silicon nitride films with different compositions are used. Among them, a silicon-rich film with a high silicon content is first deposited, with a thickness of 10 nanometers, a chemical composition of SiNx:H, X=1.1, and a corresponding refractive index of 2.2. A transition layer of silicon nitride is then deposited. Finally, a silicon nitride film with a composition close to the stoichiometric ratio is deposited, with a thickness of 50 nanometers, a chemical composition of SiNx:H, X=1.8, and a corresponding refractive index of 1.8. The silicon nitride transition layer has a refractive index between the lowermost layer and the uppermost silicon nitride film, has a thickness of 25 nanometers, and has a silicon content between the lowermost layer and the uppermost silicon nitride film. In the third embodiment, a silicon nitride film with a graded composition is used. The chemical composition of the thin film deposited on th...
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